Logic diagnosis, the process of identifying and locating possible defects in failing integrated
circuits, is a key step in yield learning for both technology development and high-volume …

IC diagnosis, as a key-step of yield learning, helps to uncover the root cause of chip failure.
High quality diagnosis results, measured in terms of accuracy and resolution, are crucial for …

Given the inherent perturbations during the fabrication process of integrated circuits that
lead to yield loss, diagnosis of failing chips is a mitigating method employed during both …

Failure diagnosis is a software-based, data-driven procedure. Collecting an excessive
amount of fail data not only increases the overall test cost but can also potentially reduce …

Diagnosis is crucial in order to establish the root cause of observed failures in Systems-on-
Chip (SoC). In this paper, we present a new framework based on supervised learning for cell …

In this paper, we propose a new learning-guided approach for diagnosis of intra-cell defects
that may occur in customer returns. In the first part of the paper, only static defects modeled …

The first step when a customer return occurs in industry is to reproduce the failure
mechanism with any original test and test conditions (voltage, temperature, etc.) used during …

This paper presents a new cell-aware diagnosis flow that can be used to address a specific
scenario (test protocol) one may encounter during diagnosis of customer returns. In this flow …

In critical (eg automotive) applications, Systems-on-Chip (SoC) failures that occurred during
mission mode (in the field) are the most critical since they may lead to catastrophic effects. In …

Logic diagnosis is a software-based methodology to identify the behavior and location of
defects in failing integrated circuits, which is an essential step in yield learning. However …