Thermal probe maskless lithography for 27.5 nm half-pitch Si technology

LL Cheong, P Paul, F Holzner, M Despont… - Nano …, 2013 - ACS Publications
Thermal scanning probe lithography is used for creating lithographic patterns with 27.5 nm
half-pitch line density in a 50 nm thick high carbon content organic resist on a Si substrate …

[HTML][HTML] Fluorine-based plasmas: main features and application in micro-and nanotechnology and in surface treatment

C Cardinaud - Comptes Rendus Chimie, 2018 - Elsevier
Fluorine cold plasmas produced by an electrical discharge in SF 6, CF 4, CHF 3 or C 4 F 8
gases, principally, have two main fields of application. The first and historical application is …

Rethinking surface reactions in nanoscale dry processes toward atomic precision and beyond: a physics and chemistry perspective

K Ishikawa, T Ishijima, T Shirafuji… - Japanese Journal of …, 2019 - iopscience.iop.org
In this review, we discuss the progress of emerging dry processes with atomic precision.
Researchers in the field of plasma processing and surface science have addressed the …

Two-step cycling process alternating implantation and remote plasma etching for topographically selective etching: Application to Si3N4 spacer etching

V Renaud, C Petit-Etienne, JP Barnes… - Journal of Applied …, 2019 - pubs.aip.org
This article proposes an original method to achieve topographically selective etching. It
relies on cycling a two-step process comprising a plasma implantation step and a removal …

MD simulations of low energy Clx+ ions interaction with ultrathin silicon layers for advanced etch processes

P Brichon, E Despiau-Pujo, O Joubert - Journal of Vacuum Science & …, 2014 - pubs.aip.org
Molecular dynamics simulations of low-energy (5–100 eV) Cl+ and Cl 2+ bombardment on
(100) Si surfaces are performed to investigate the impact of plasma dissociation and very …

Microelectronic method for etching a layer

N Posseme, O Joubert, L Vallier - US Patent 9,570,317, 2017 - Google Patents
A microelectronic method for etching a layer to be etched, including: modifying the layer to
be etched from a surface of the layer to be etched and over a depth corresponding to at least …

Ion flux and ion distribution function measurements in synchronously pulsed inductively coupled plasmas

M Brihoum, G Cunge, M Darnon, D Gahan… - Journal of Vacuum …, 2013 - pubs.aip.org
Changes in the ion flux and the time-averaged ion distribution functions are reported for
pulsed, inductively coupled RF plasmas (ICPs) operated over a range of duty cycles. For …

Key plasma parameters for nanometric precision etching of Si films in chlorine discharges

P Brichon, E Despiau-Pujo, O Mourey… - Journal of Applied …, 2015 - pubs.aip.org
Ultrathin layered films in new transistors architectures (FinFET and fully depleted SOI)
require damage-free plasma etching techniques with unprecedented selectivity between …

Pulsed Cl2/Ar inductively coupled plasma processing: 0D model versus experiments

E Despiau-Pujo, M Brihoum, P Bodart… - Journal of Physics D …, 2014 - iopscience.iop.org
Comparisons between measurements and spatially-averaged (0D) simulations of low-
pressure Ar and Cl 2 pulsed-plasmas in an industrial inductively coupled reactor are …

Helium plasma modification of Si and Si3N4 thin films for advanced etch processes

V Martirosyan, E Despiau-Pujo, J Dubois… - Journal of Vacuum …, 2018 - pubs.aip.org
To achieve the etching of silicon nitride spacers with a perfect anisotropy and an almost
infinite selectivity, an alternative method consisting of two sequential steps—surface …