[PDF][PDF] An introduction to asynchronous circuit design

A Davis, SM Nowick - The Encyclopedia of Computer Science and …, 1997 - Citeseer
The purpose of this monograph is to provide both an introduction to eld of asynchronous
digital circuit design and an overview of the practical state of the art in 1997. In the early …

Defect-oriented testability for asynchronous ICs

M Roncken - Proceedings of the IEEE, 1999 - ieeexplore.ieee.org
For a CMOS manufacturing process, asynchronous ICs are similar to synchronous ICs. The
defect density distributions are similar, and hence, so are the fault models and fault …

A survey about testing asynchronous circuits

S Zeidler, M Krstić - … Conference on Circuit Theory and Design …, 2015 - ieeexplore.ieee.org
Even though the asynchronous design methodology is considered to be a promising
solution to upcoming challenges of designing complex integrated circuits (ICs), it is not …

[图书][B] Encyclopedia of Computer Science and Technology: Volume 38-Supplement 23: Algorithms for Designing Multimedia Storage Servers to Models and …

A Kent, JG Williams - 2021 - taylorfrancis.com
Volume 38-Supplement 23: Algorithms for Designing Multimedia Storage Servers to Models
and Architectures. Covering more than basic computer commands and procedures, this …

A BIST scheme for asynchronous logic

VC Alves, FMG Franca… - … Seventh Asian Test …, 1998 - ieeexplore.ieee.org
This work introduces a methodology to ease the implementation of BIST in asynchronous
circuits. Scheduling by edge reversal (SER), a simple but powerful distributed synchronizer …

Design of a test processor for asynchronous chip test

S Zeidler, C Wolf, M Krstic, F Vater… - 2011 Asian Test …, 2011 - ieeexplore.ieee.org
Due to asynchronous timing and arbitration asynchronous designs may behave no
deterministically. For the test of such systems, this means that an exact timing, ie a tester …

On-line testing of bundled-data asynchronous handshake protocols

S Zeidler, A Bystrov, M Krstic… - 2010 IEEE 16th …, 2010 - ieeexplore.ieee.org
Asynchronous interfaces, being a popular way of dealing with timing closure problems in
deep submicron SoCs, pose a serious problem for on-line testing. Their behavior is …

[PDF][PDF] Full scan testing of handshake circuits

FJ te Beest - 2003 - research.utwente.nl
The drive for more power-efficient circuits has been one of the main reasons to search for
alternatives for the conventional synchronous circuit design style. One of the main obstacles …

At-speed DfT Architecture for Bundled-data Design

RA Guazzelli, L Fesquet - 2020 IEEE International Test …, 2020 - ieeexplore.ieee.org
At-speed testing for asynchronous circuits is still an open concern in the literature. Due to its
timing constraints between control and data paths, Design for Testability (DfT) …

[PDF][PDF] The 'Asynchronous' Bibliography

AMG Peeters - Available for anony-mous ftp on Internet. Uniform …, 2004 - Citeseer
[20] AJ Acosta, R. Jiménez, A. Barriga, MJ Bellido, M. Valencia, and JL Huertas,“Design and
characterisation of a CMOS VLSI self-timed multiplier architecture based on a bit-level …