Modeling of short-channel effects in GaN HEMTs

M Allaei, M Shalchian, F Jazaeri - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
In this article, we propose an explicit and analytic charge-based model for estimating short-
channel effects (SCEs) in GaN high-electron-mobility transistor (HEMT) devices. The …

[HTML][HTML] Optimization AlGaN/GaN HEMT with field plate structures

N Shi, K Wang, B Zhou, J Weng, Z Cheng - Micromachines, 2022 - mdpi.com
AlGaN/GaN HEMTs with several different designs of field plate structure are studied for
device optimization purposes. To increase device breakdown voltage, optimal dimensions of …

Analysis of dielectric, impedance and electrical properties of interfacial layer: AlN

DE Yıldız, A Tataroglu - Journal of Materials Science: Materials in …, 2023 - Springer
The purpose of this study is to investigate the electric and dielectric properties of Au/Ti/AlN/n-
Si device with using admittance measurements. Aluminum nitride (AlN) epitaxial template on …

Interfacial Vacancies in /(,)/ Heterostructures

V Prozheeva, I Makkonen, H Li, S Keller, UK Mishra… - Physical Review …, 2020 - APS
We show that N-polar Ga N/(Al, Ga) N/Ga N heterostructures exhibit significant N deficiency
at the bottom (Al, Ga) N/Ga N interface, and that these N vacancies are responsible for the …

Theoretical prediction of mobility improvement in GaN-based HEMTs at high carrier densities

I Berdalovic, M Poljak, T Suligoj - IEEE transactions on electron …, 2023 - ieeexplore.ieee.org
In this article, we use a semiclassical low-field mobility modeling framework, which includes
all relevant scattering mechanisms, to examine the dependence of electron mobility on 2-D …

Electrical parameters and low-frequency noise of AlGaN/GaN high-electron mobility transistors with different channel orientation

MGC de Andrade, CR Nogueira, NG Júnior… - Solid-State …, 2024 - Elsevier
Abstract The performance of AlGaN/GaN High-Electron Mobility Transistors (HEMTs)
fabricated on< 1 1 1> silicon substrates has been experimentally investigated, aiming to …

Deep-Level Transient Spectroscopy of Nanoridge Diodes Grown on Substrates

O Syshchyk, B Hsu, H Yu, V Motsnyi, A Vais… - Physical Review …, 2020 - APS
Monolithically integrated Ga As pin diodes are demonstrated on 300-mm Si (001) substrates
using a nanoridge-engineering approach. Deep-level transient spectroscopy (DLTS) is used …

[HTML][HTML] Post-CMOS processing challenges and design developments of CMOS-MEMS microheaters for local CNT synthesis

A Roy, BQ Ta, M Azadmehr… - Microsystems & …, 2023 - nature.com
Carbon nanotubes (CNTs) can be locally grown on custom-designed CMOS microheaters
by a thermal chemical vapour deposition (CVD) process to utilize the sensing capabilities of …

Gate dielectric material influence on DC behavior of MO (I) SHEMT devices operating up to 150° C

PGD Agopian, GJ Carmo, JA Martino, E Simoen… - Solid-State …, 2021 - Elsevier
In this work, the DC behavior of AlGaN/GaN Metal-Insulator-Semiconductor high electron
mobility transistors (MO (I) SHEMTs) with two different gate dielectrics (Al 2 O 3 and Si 3 N 4) …

Effect of Si-rich SiXNY multilayer passivation material on the DC electrical characteristics of AlGaN/GaN HEMTs

AS Dinçer, MT Haliloğlu, A Toprak, Ş Altındal… - Journal of Materials …, 2023 - Springer
In this study, the effect of Si XNY bilayer passivation materials on the electrical properties of
an AlGaN high electron mobility transistor (HEMT) was investigated. AlGaN/GaN HEMTs …