MLCAD: A survey of research in machine learning for CAD keynote paper

M Rapp, H Amrouch, Y Lin, B Yu… - … on Computer-Aided …, 2021 - ieeexplore.ieee.org
Due to the increasing size of integrated circuits (ICs), their design and optimization phases
(ie, computer-aided design, CAD) grow increasingly complex. At design time, a large design …

GAN-OPC: Mask optimization with lithography-guided generative adversarial nets

H Yang, S Li, Y Ma, B Yu, EFY Young - Proceedings of the 55th Annual …, 2018 - dl.acm.org
Mask optimization has been a critical problem in the VLSI design flow due to the mismatch
between the lithography system and the continuously shrinking feature sizes. Optical …

DAMO: Deep agile mask optimization for full chip scale

G Chen, W Chen, Y Ma, H Yang, B Yu - Proceedings of the 39th …, 2020 - dl.acm.org
Continuous scaling of the VLSI system leaves a great challenge on manufacturing, thus
optical proximity correction (OPC) is widely applied in conventional design flow for …

Machine learning for yield learning and optimization

Y Lin, MB Alawieh, W Ye, DZ Pan - 2018 IEEE International Test …, 2018 - ieeexplore.ieee.org
Yield learning and optimization are critical for advanced IC design and manufacturing.
Recent advance in machine learning has brought a lot of new opportunities in improving the …

Lithobench: Benchmarking ai computational lithography for semiconductor manufacturing

S Zheng, H Yang, B Zhu, B Yu… - Advances in Neural …, 2024 - proceedings.neurips.cc
Computational lithography provides algorithmic and mathematical support for resolution
enhancement in optical lithography, which is the critical step in semiconductor …

DevelSet: Deep neural level set for instant mask optimization

G Chen, Z Yu, H Liu, Y Ma, B Yu - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
As one of the key techniques for resolution enhancement technologies (RETs), optical
proximity correction (OPC) suffers from prohibitive computational costs as feature sizes …

Generic lithography modeling with dual-band optics-inspired neural networks

H Yang, Z Li, K Sastry, S Mukhopadhyay… - Proceedings of the 59th …, 2022 - dl.acm.org
Lithography simulation is a critical step in VLSI design and optimization for
manufacturability. Existing solutions for highly accurate lithography simulation with rigorous …

L2o-ilt: Learning to optimize inverse lithography techniques

B Zhu, S Zheng, Z Yu, G Chen, Y Ma… - … on Computer-Aided …, 2023 - ieeexplore.ieee.org
Inverse lithography technique (ILT) is one of the most widely used resolution enhancement
techniques (RETs) to compensate for the diffraction effect in the lithography process …

Neural-ILT: Migrating ILT to neural networks for mask printability and complexity co-optimization

B Jiang, L Liu, Y Ma, H Zhang, B Yu… - Proceedings of the 39th …, 2020 - dl.acm.org
Optical proximity correction (OPC) for advanced technology node now has become
extremely expensive and challenging. Conventional model-based OPC encounters …

A GPU-enabled level-set method for mask optimization

Z Yu, G Chen, Y Ma, B Yu - IEEE Transactions on Computer …, 2022 - ieeexplore.ieee.org
As the feature size of advanced integrated circuits keeps shrinking, resolution enhancement
techniques (RETs) are utilized to improve the printability in the lithography process. Optical …