R Singh - Microelectronics reliability, 2006 - Elsevier
Despite silicon carbide's (SiC's) high breakdown electric field, high thermal conductivity and wide bandgap, it faces certain reliability challenges when used to make conventional power …
T Kozaki, M Sano, S Nakamura… - US Patent 7,496,124, 2009 - Google Patents
(57) ABSTRACT A nitride semiconductor laser device has an improved stabil ity of the lateral mode under high output power and a longer lifetime, so that the device can be applied to …
L Forbes - US Patent 7,241,658, 2007 - Google Patents
(57) ABSTRACT A high density vertical gain cell is realized for memory operation. The gain cell includes a vertical MOS transistor used as a sense transistor having a floating body …
S Sapp - US Patent 6,710,403, 2004 - Google Patents
In accordance with an embodiment of the present invention, a MOSFET includes a first semiconductor region of a first conductivity type, a gate trench which extends into the first …
WP Noble, L Forbes, KY Ahn - US Patent 6,150,687, 2000 - Google Patents
US6150687A - Memory cell having a vertical transistor with buried source/drain and dual gates - Google Patents US6150687A - Memory cell having a vertical transistor with buried …
A Challa, A Elbanhawy, DE Probst, SP Sapp… - US Patent …, 2012 - Google Patents
(57) ABSTRACT A method of manufacturing a semiconductor device having a charge control trench and an active control trench with a thick oxide bottom includes forming a drift …
Evolutionary improvements in silicon (Si) power devices through better device designs, processing techniques, and material quality have led to great advancements in power …
S Sapp, H Yilmaz, CL Rexer, D Calafut - US Patent 7,504,306, 2009 - Google Patents
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