Analysis and experimental test of electrical characteristics on bonding wire

W Tian, H Cui, W Yu - Electronics, 2019 - mdpi.com
In this paper, electrical characteristic analysis and corresponding experimental tests on gold
bonding wire are presented. Firstly, according to EIA (Electronic Industries …

[HTML][HTML] Closed-loop recycling process flow for diamond betavoltaics

Y Verbelen, M Boardman, H Dominguez… - 2022-Sustainable …, 2022 - flogen.org
The invention of 14 C-based solid state diamond power-cells offers unique opportunities for
demonstrating a circular economy in relation to fissile energy production; and closed-loop …

LED arrays of laser printers as valuable sources of electromagnetic waves for acquisition of graphic data

I Kubiak, J Loughry - Electronics, 2019 - mdpi.com
Classified information may be derivable from unintended electromagnetic signals. This
article presents a technical analysis of LED arrays used in monochrome computer printers …

Mechanism of wire bond shear testing

S Manoharan, C Patel, S Hunter, P McCluskey - Microelectronics Reliability, 2018 - Elsevier
Shear testing of wire bonds in microelectronics devices is important in bonding process
qualification, but the actual mechanism of shearing Cu bonds from Al pads is not thoroughly …

Additive Manufacturing Based Dissolvable Chip Packaging for Sustainable E‐Waste Reduction

D Belkadi, MS Kim, CP Hahn, S Saleha… - Advanced …, 2024 - Wiley Online Library
Electronics have contributed to the advancement of healthcare, wellness, security, and
mobility, resulting in a higher standard of living. However, these ever‐accelerating …

Life prediction of copper wire bonds in commercial devices using principal component analysis (PCA)

S Manoharan, C Patel, S Dunford, J Beshears… - Microelectronics …, 2019 - Elsevier
Copper has been widely adopted as a viable alternative to gold for wire bonding, due to its
lower cost, better electrical and thermal conductivity, lower tendency for wire sweep due to a …

Additively Manufactured Dissolvable Electronics Packaging for Sustainability

D Belkadi, MS Kim, CP Hahn, S Saleha… - 2024 IEEE 74th …, 2024 - ieeexplore.ieee.org
As the prevalence of electronics increases and their lifespan decreases, the volume of
electronic waste (E-waste) continues to grow. Recycling E-waste poses challenges due to …

Thermo-mechanical design considerations in 3D-integrated SiC power device package

FP McCluskey, H Yun, CE Buxbaum… - 2020 19th IEEE …, 2020 - ieeexplore.ieee.org
Wide bandgap semiconductors, such as silicon carbide (SiC), have properties that allow
them to surpass the performance of conventional silicon (Si) semiconductors in power …

Failure Analysis of Aluminum Wire Bonds in Automotive Pressure Sensors in Thermal Shock Environments

J Yang, P Zheng, X Liu, Q Song, Y Zhu, B Song… - IEEE …, 2021 - ieeexplore.ieee.org
Wire bonding remains one of the most widely adopted interconnection techniques in the
field of electronic packaging. At present, the most effective way to ensure a long life and high …

Influence of initial shear strength on time-to-failure of copper (Cu) wire bonds in thermal aging condition

S Manoharan, C Patel, S Hunter… - Additional Papers …, 2018 - meridian.allenpress.com
Copper (Cu) wire bond is used in a majority of microelectronic devices but has not been fully
accepted by all industries due to potential reliability issues. Good quality bond is believed to …