State of the art review on process, system, and operations control in modern manufacturing

D Djurdjanovic, L Mears… - Journal of …, 2018 - asmedigitalcollection.asme.org
Dramatic advancements and adoption of computing capabilities, communication
technologies, and advanced, pervasive sensing have impacted every aspect of modern …

A uniaxial testing approach for consistent failure in vascular tissues

C Sang, S Maiti, RN Fortunato… - Journal of …, 2018 - asmedigitalcollection.asme.org
Although uniaxial tensile testing is commonly used to evaluate failure properties of vascular
tissue, there is no established protocol for specimen shape or gripping method. Large …

Adaptive weight tuning of EWMA controller via model-free deep reinforcement learning

Z Ma, T Pan - IEEE Transactions on Semiconductor …, 2022 - ieeexplore.ieee.org
Exponentially weighted moving average (EWMA) controllers have been extensively studied
for run-to-run (RtR) control in semiconductor manufacturing processes. However, the EWMA …

Reinforcement learning for process control with application in semiconductor manufacturing

Y Li, J Du, W Jiang - IISE Transactions, 2024 - Taylor & Francis
Process control is widely discussed in the manufacturing process, especially in
semiconductor manufacturing. Due to unavoidable disturbances in manufacturing, different …

MFRL-BI: Design of a model-free reinforcement learning process control scheme by using Bayesian inference

Y Li, J Du, W Jiang, F Tsung - IISE Transactions, 2024 - Taylor & Francis
Abstract Design of the process control scheme is critical for quality assurance to reduce
variations in manufacturing systems. Taking semiconductor manufacturing as an example …

Modeling and analysis of nonlinear wave propagation in one-dimensional phononic structures

M Liu, WD Zhu - Journal of Vibration and Acoustics, 2018 - asmedigitalcollection.asme.org
Different from elastic waves in linear periodic structures, those in phononic crystals (PCs)
with nonlinear properties can exhibit more interesting phenomena. Linear dispersion …

Deep reinforcement learning-assisted extended state observer for run-to-run control in the semiconductor manufacturing process

Z Ma, T Pan - Transactions of the Institute of Measurement …, 2024 - journals.sagepub.com
In the semiconductor manufacturing process, extended state observer (ESO)-based run-to-
run (RtR) control is an intriguing solution. Although an ESO-RtR control strategy can …

Process and operations control in modern manufacturing

D Djurdjanovic, L Mears… - International …, 2017 - asmedigitalcollection.asme.org
Dramatic advancements and adoption of computing capabilities, communication
technologies, and advanced, pervasive sensing have impacted every aspect of modern …

Cycle forecasting EWMA (CF-EWMA) approach for drift and fault in mixed-product run-to-run process

B Ai, Y Zheng, Y Wang, SS Jang, T Song - Journal of Process Control, 2010 - Elsevier
In semiconductor manufacturing processes, mixed-products are usually fabricated on the
same set of process tool with different recipes. Run-to-run controllers which based on the …

A batch-based run-to-run process control scheme for semiconductor manufacturing

K Wang, K Han - IIE Transactions, 2013 - Taylor & Francis
Run-to-Run (R2R) control has been widely used in semiconductor manufacturing to
compensate for process disturbance and to improve quality. The traditional R2R controller …