In semiconductor heteroepitaxy the growing film frequently undergoes a series of strain relief mechanisms that may include surface reconstruction, step bunching, faceting, and finally …
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing …
K Brunner - Reports on Progress in Physics, 2001 - iopscience.iop.org
A review is given on the formation mechanisms and the properties of Si/Ge nanostructures that have been synthesized by self-assembling and self-ordering during heteroepitaxy …
On a vicinal surface under stress, elastic relaxation at steps produces a long-range attractive interaction between the steps. As a result, the surface is unstable against step bunching …
F Liu, F Wu, MG Lagally - Chemical reviews, 1997 - ACS Publications
Conventional surface probes are usually diffraction-based techniques, by which real-space surface structures are indirectly derived from their representations in the reciprocal space …
Nanotechnologies of the future will demand the creation of large arrays of nanoscale structures and morphologies for electronic and optoelectronic devices. One approach to the …
We report new types of kinetic growth instabilities during silicon homoepitaxy on vicinal Si (001) surfaces with miscut angles≤ 2∘. They occur under frequently employed growth …
Germanium (Ge), the next-in-line group-IV material, bears great potential to add functionality and performance to next-generation nanoelectronics and solid-state quantum transport …
C Lund, M Catalano, L Wang, C Wurm… - Journal of Applied …, 2018 - pubs.aip.org
N-polar InN layers were deposited using MOCVD on GaN-on-sapphire templates which were miscut 4 towards the GaN m-direction. For thin layers, quantum dot-like features were …