Simplifying and interpreting two-tone measurements

KA Remley, DF Williams… - IEEE Transactions on …, 2004 - ieeexplore.ieee.org
We develop a mathematical description of the response of weakly nonlinear systems to
second-order memory mechanisms. Our description is based on a time-varying gain …

Recurrent neural network technique for behavioral modeling of power amplifier with memory effects

S Yan, C Zhang, QJ Zhang - International Journal of RF and …, 2015 - Wiley Online Library
ABSTRACT A new technique for behavioral modeling of power amplifier (PA) with short‐and
long‐term memory effects is presented here using recurrent neural networks (RNNs). RNN …

Dynamic-bias S-parameters: A new measurement technique for microwave transistors

G Avolio, A Raffo, V Vadalà, G Vannini… - IEEE Transactions …, 2016 - ieeexplore.ieee.org
We present the first application of the recently introduced dynamic-bias measurement to the
acquisition of the scattering (S-) parameters of microwave transistors under large signal …

Bias and frequency dependence of FET characteristics

AE Parker, JG Rathmell - IEEE Transactions on Microwave …, 2003 - ieeexplore.ieee.org
A novel measurement of the dynamics of high electron-mobility transistor (HEMT) and
MESFET behavior permits classification of rate-dependence mechanisms and identification …

Investigation of Gallium Nitride Based HEMTs with Thermal Dissipation

HX Zheng, WA Lee Sanchez, KL Lin… - Advanced Electronic …, 2024 - Wiley Online Library
The heat dissipation optimization process is a crucial element in high power high electron
mobility transistor (HEMT) components fabricated using the Gallium Nitride grown on silicon …

Isothermal Characterization of Traps in GaN HEMTs Operating in Class B Using a Real-Time Pulsed-RF NVNA Testbed

M Lindquist, P Roblin, D Mikrut… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
This article presents a real-time nonlinear vector network analyzer (NVNA) testbed that
enables the acquisition of the isothermal transient response of GaN HEMTs operating in …

New pulsed measurement setup for GaN and GaAs FETs characterization

A Santarelli, R Cignani, D Niessen… - International Journal of …, 2012 - cambridge.org
A new setup is proposed for the measurement of current–voltage pulsed characteristics of
electron devices. The main advantages of the system consist in: shorter pulse widths …

Impact-ionization effects on the high-frequency behavior of HFETs

M Isler, K Schunemann - IEEE transactions on microwave …, 2004 - ieeexplore.ieee.org
A new small-signal equivalent-circuit model is presented, which takes into account strong
impact-ionization effects on the high-frequency behavior of heterostructure field-effect …

[PDF][PDF] Electrical characteristics of passivated Pseudomorphic HEMTs with P2S5/(NH4) 2SX pretreatment

HC Chiu, YC Huang, CW Chen… - IEEE Transactions on …, 2008 - academia.edu
This paper elucidates the dc, pulse I–V, microwave, flicker noise, and power properties of
AlGaAs/InGaAs pseudomorphic high electron mobility transistors (pHEMTs) after various ex …

Large-signal network analysis including the baseband

G Pailloncy, G Avolio, M Myslinski… - IEEE Microwave …, 2011 - ieeexplore.ieee.org
In recent years, wireless systems have rapidly evolved due to the increasing demands of
different services, functionalities, and applications. In order to provide high-speed …