Fail data collection is carried out for faulty units to allow defect diagnosis to be performed.
After passing scan chain tests, fail data collection targets faults in the functional logic …

In the early stages of yield improvement, a faulty unit may produce a large volume of fail data
because of the presence of multiple defects in the functional logic. Earlier solutions that …

Fail data is collected by a tester from faulty units to allow defect diagnosis to be carried out.
The fail data describes the full output response of the unit. The volume of fail data that faulty …

As part of a yield improvement process, fail data is collected from faulty units. Several
approaches exist for reducing the tester time and the volume of fail data that needs to be …

A logic diagnosis procedure produces a set of can-didate faults that are expected to identify
the defects present in a faulty chip. To reduce the number of candidates produced …

During fail data collection, a tester collects information that is useful for defect diagnosis. If
fail data collection can be terminated early, the tester time as well as the volume of fail data …

Yield improvement requires information about the defects present in faulty units. This
information is derived by applying a logic diagnosis procedure to the fail data collected by a …

Volume logic diagnosis is typically applied in two phases. In the first phase, a fault detection
test set is used for collecting fail data and performing logic diagnosis. If the fail data based …

A test reordering algorithm is presented to improve the results of scan chain diagnosis when
a limited amount of fail data is collected by the tester. Tests are reordered based on …

Scan chain faults that affect the scan logic of a design are important to diagnose. However,
scan chain faults create large volumes of fail data that make it necessary to terminate the fail …