Characterization and modeling of pattern dependencies in copper interconnects for integrated circuits

TH Park - 2002 - dspace.mit.edu
Copper metallization has emerged as the leading interconnect technology for deep sub-
micron features, where electroplating and chemical mechanical polish (CMP) processes …

Chemical mechanical polishing compositions for metal and associated materials and method of using same

Y Ma, W Wojtczak, C Regulski, TH Baum… - US Patent …, 2004 - Google Patents
The present invention relates to a chemical mechanical polishing composition for Surfaces
of a Semiconductor wafer, and more particularly, to a chemical mechanical polishing Slurry …

Chemical mechanical polishing compositions for metal and associated materials and method of using same

Y Ma, W Wojtczak, C Regulski, TH Baum… - US Patent …, 2006 - Google Patents
(57) ABSTRACT A chemical mechanical polishing slurry composition and method for using
the slurry composition for polishing copper, barrier material and dielectric material that com …

Analysis of retaining ring using finite element simulation in chemical mechanical polishing process

SP Lo, YY Lin, JC Huang - The International Journal of Advanced …, 2007 - Springer
During the chemical mechanical polishing process (ie, CMP for short), it is expected to attain
the requirement of global planarization. However, the stress concentration, which occurred …

Modeling of chemical mechanical polishing for shallow trench isolation

B Lee - 2002 - dspace.mit.edu
This thesis presents the nonlinear analysis, design, fabrication, and testing of an axial-gap
magnetic induction micro machine, which is a two-phase planar motor in which the rotor is …

Nonuniformity of wafer and pad in CMP: Kinematic aspects of view

T Feng - IEEE transactions on semiconductor manufacturing, 2007 - ieeexplore.ieee.org
In this paper, we analyze the nonuniformity of sliding distance on both the wafer and
polishing pad from a kinematic point of view. Using the Fourier series expansion, it can be …

A novel fluorescence based method of assessing subsurface damage in optical materials

WB Williams - 2009 - search.proquest.com
Lapping and polishing are loose abrasive finishing processes that have been used to
achieve critical surface parameters in optical materials for centuries. These processes …

Modal analysis of multi-layer structure for chemical mechanical polishing process

JT Chiu, YY Lin - The International Journal of Advanced Manufacturing …, 2008 - Springer
In this study, a three-dimensional finite element model was established to perform modal
analysis of the chemical mechanical polishing process. The contact boundary conditions …

Epitaxial growth for waveguide tapering

MT Morse - US Patent 6,956,983, 2005 - Google Patents
A method to form a semiconductor taper without etching the taper surfaces. In one
embodiment, a semiconductor waveguide is formed on a workpiece having an unwatched …

Fabrication of a waveguide taper through ion implantation

MS Salib, MT Morse - US Patent 6,989,284, 2006 - Google Patents
A method to form a taper in a semiconductor layer. In one embodiment, the semiconductor
layer is formed on a cladding layer. A mask layer is formed on the semiconductor layer. The …