Dynamic budget analysis of multiple parameters in a lithography system based on the superposition of light intensity fluctuations

J Wang, X Su, L Dong, T Fan, Y Wei - Optics Express, 2024 - opg.optica.org
Lithography is one of the most critical processes in the manufacturing of micro-and nano-
devices. As device critical dimensions continue to shrink, variations in system parameters …

Probability distribution-based method for aberration budgeting in EUV lithography

J Wang, X Su, Y Su, Y Wei - Optics Express, 2024 - opg.optica.org
Extreme ultraviolet (EUV) lithography is one of the most indispensable technologies in
semiconductor manufacturing for 7 nm and smaller technology nodes. However, many key …

Adopting combined feed forward solution in HVM fab to improve on product overlay

S Zeng, X Huang, T Zhang, N Lu, D Wu… - Metrology …, 2022 - spiedigitallibrary.org
As 3D NAND advanced technology moves to increasingly denser storage capacity, the film
stacks required to create these devices correspondingly increase in quantity and height …

Optimal thermal actuation for mitigation of heat-induced wafer deformation

DWM Veldman, RHB Fey, H Zwart… - … on Control Systems …, 2019 - ieeexplore.ieee.org
An important step in the production of integrated circuits is the projection of the pattern of
electronic connections on a silicon wafer. The light used to project the pattern moves over …

Overlay error statistics for multiple-exposure patterning

AH Gabor, NM Felix - Journal of Micro/Nanolithography …, 2019 - spiedigitallibrary.org
Background: The mathematical equations that explain overlay error of multiple-exposure
patterning schemes have not been fully described in the literature and some commonly …

[PDF][PDF] Modeling and control of thermomechanical systems: Managing heat-induced deformation in extreme ultraviolet lithography

DWM Veldman - 2020 - research.tue.nl
In the past four decades, the number of electrical components that can be fitted into a single
integrated circuit has increased exponentially. This trend has enabled the production of …

Design of n+-base width of two-terminal-electrode vertical thyristor for cross-point memory cell without selector

BS Lee, MW Kim, JH Kim, SD Yoo, TH Shim… - …, 2021 - iopscience.iop.org
The n+-base width of a two-terminal vertical thyristor fabricated with n++(top-emitter)-
p+(base)-n+(base)-p++(bottom-emitter) epitaxial Si layers was designed to produce a cross …

The use of cross-validation for overlay model selection

S Jung, C Utzny - 38th European Mask and Lithography …, 2023 - spiedigitallibrary.org
Overlay requirements are becoming more demanding as the semiconductor device design
dimensions continue to reduce in size. Thus, it is increasingly crucial to control overlay …

Smart Active Aerostatic Bearing

N Maamari - 2019 - research-collection.ethz.ch
Bearings and guideways are critical components in precision positioning machines. Among
diverse types of bearing technologies, passive aerostatic bearings offer excellent precision …

Overlay optimization

RP Good, IR Krumanocker - US Patent 11,036,912, 2021 - Google Patents
The present disclosure generally relates to semiconductor structures and, more particularly,
to overlay optimization and methods of manufacture. The method includes performing, by a …