Scanning microwave microscopy (SMM) is a novel metrological tool that advances the
quantitative, nanometric, high-frequency, electrical characterization of a broad range of …

This paper presents the analytical derivation of spreading resistance expressions for diverse
geometries of a conducting probe submerged in a lossy medium. Resulting equations can …

If the Twentieth Century boasted of the Space Age and the Computer Age, the Twenty-First
Century is certainly starting off with the Age of Biology, or at least Biochemistry. The …

The inverted scanning microwave microscope (iSMM) is a recently developed variety of
scanning microprobe microscopes. Similar to a scanning microwave microscope (SMM), the …

This work details an effective dynamic chemical etching technique to fabricate ultra-sharp
tips for Scanning Near-Field Microwave Microscopy (SNMM). The protruded cylindrical part …

In the field of materials research, scanning microwave microscopy imaging has already
become a vital research tool due to its high sensitivity and nondestructive testing of samples …

In this paper, an inverted scanning microwave microscope (iSMM) is used to characterize
the channel of a gateless GaN/AIN high-electron-mobility transistor (HEMT). Unlike …