Deep Reinforcement Learning for Image-Based Multi-Agent Coverage Path Planning

Progressive Hierarchical Deep Reinforcement Learning for defect wafer test

M Xu, X Chen, Y She, J Wang - Knowledge-Based Systems, 2024 - Elsevier
Wafer testing plays a critical role in the wafer fabrication process. It involves using a probe to
inspect all the wafers on a map, which presents a Coverage Path Planning (CPP) problem …
相关文章