SRAM stability analysis for different cache configurations due to bias temperature instability and hot carrier injection

T Liu, CC Chen, J Wu, L Milor - 2016 IEEE 34th International …, 2016 - ieeexplore.ieee.org
Bias Temperature Instability (BTI) and Hot Carrier Injections (HCI) are two of the main effects
that increase a transistor's threshold voltage and further cause performance degradations …

On microarchitectural mechanisms for cache wearout reduction

A Valero, N Miralaei, S Petit… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main
deleterious effects that increase a transistor's threshold voltage over the lifetime of a …

Multicore processor—Architecture and programming

N Sudha - 2015 19th International Symposium on VLSI Design …, 2015 - ieeexplore.ieee.org
In the past, speedup has been achieved in a processor by increasing clock speed. Multicore
processors are the new direction semiconductor companies are focusing on to get a boost in …

[引用][C] COMPREHENSIVE VARIATION-AWARE AGING SIMULATOR FOR LOGIC TIMING AND SRAM STABILITY

T Liu - 2017 - Georgia Institute of Technology