A review on fault detection and process diagnostics in industrial processes

YJ Park, SKS Fan, CY Hsu - Processes, 2020 - mdpi.com
The main roles of fault detection and diagnosis (FDD) for industrial processes are to make
an effective indicator which can identify faulty status of a process and then to take a proper …

Fault detection using the k-nearest neighbor rule for semiconductor manufacturing processes

QP He, J Wang - IEEE transactions on semiconductor …, 2007 - ieeexplore.ieee.org
It has been recognized that effective fault detection techniques can help semiconductor
manufacturers reduce scrap, increase equipment uptime, and reduce the usage of test …

A literature review and future research agenda on fault detection and diagnosis studies in marine machinery systems

M Orhan, M Celik - … of the Institution of Mechanical Engineers …, 2024 - journals.sagepub.com
Fault detection and diagnostics (FDD) have great potential to enable safety, efficiency, and
reliability measures of critical machinery systems. However, it is clear that there is a lack of …

A predictive maintenance system for epitaxy processes based on filtering and prediction techniques

GA Susto, A Beghi, C De Luca - IEEE Transactions on …, 2012 - ieeexplore.ieee.org
Silicon epitaxial deposition is a process strongly influenced by wafer temperature behavior,
which has to be constantly monitored to avoid the production of defective wafers. However …

Safety and risk analysis in digitalized process operations warning of possible deviating conditions in the process environment

C Benson, CD Argyropoulos, C Dimopoulos… - Process Safety and …, 2021 - Elsevier
The process industry operates in high risks and hazardous environments that impose
significant risks on workers' lives, assets-loss, and operational environments. Using the …

Bayesian Belief Network-based approach for diagnostics and prognostics of semiconductor manufacturing systems

L Yang, J Lee - Robotics and Computer-Integrated Manufacturing, 2012 - Elsevier
Semiconductor manufacturing is a complex process in that it requires different types of
equipments (also referred to as tools in semiconductor industry) with various control …

[PDF][PDF] Predictive models for equipment fault detection in the semiconductor manufacturing process

S Munirathinam, B Ramadoss - IACSIT International Journal of …, 2016 - researchgate.net
Semiconductor manufacturing is one of the most technologically and highly complicated
manufacturing processes. Traditional machine learning algorithms such as uni-variate and …

One class process anomaly detection using kernel density estimation methods

CI Lang, FK Sun, B Lawler, J Dillon… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
We present a one-class anomaly detection method that uses time series sensor data to
detect anomalies or faults in semiconductor fabrication processes. Critically, this method is …

Principal component based k-nearest-neighbor rule for semiconductor process fault detection

QP He, J Wang - 2008 American Control Conference, 2008 - ieeexplore.ieee.org
Fault detection and classification (FDC) has been recognized in the semiconductor industry
as an integral component of advanced process control (APC) framework in improving overall …

Fault detection and isolation in multiple MEMS-IMUs configurations

S Guerrier, A Waegli, J Skaloud… - IEEE Transactions on …, 2012 - ieeexplore.ieee.org
This research presents methods for detecting and isolating faults in multiple micro-electro-
mechanical system inertial measurement unit (MEMS-IMU) configurations. First, geometric …