Abstract Characterization and identification of recombination active defects in photovoltaic
(PV) materials are essential for improving the performance of solar cells, hence, reducing …

In the past few years, carrier-induced degradation (CID) in p-type multicrystalline silicon (mc-
Si) has been receiving significant attention. Recently, it has been reported that this material …

This study introduces a pioneering machine learning (ML)-based methodology to
characterise two-level defects in the bulk of silicon wafers. Bulk defects have a critical impact …

The performance of high-efficiency silicon solar cells is limited by the presence of bulk
defects. Identification of these defects has the potential to improve cell performance and …

Bulk defects in silicon solar cells are a key contributor to loss of efficiency. To detect and
identify those defects, temperature-and injection-dependent lifetime spectroscopy is usually …

Abstract The Newton-Raphson (NR) method is one of the most important and popular
methods to determine an optimal solution in many applications in the decision sciences and …

Temperature‐dependent measurements are extensively employed in assessing
photovoltaic materials and devices. An obvious reason is that solar cells often operate at …

Temperature‐and injection‐dependent lifetime spectroscopy (TIDLS) is extensively used for
the characterization of defects in silicon material for photovoltaic applications. By coupling …

Temperature-and injection-dependent lifetime spectroscopy (TIDLS) is employed to study
the defect responsible for light-and elevated temperature-induced degradation (LeTID). In …

Bulk defects in silicon wafers are key contributors to solar cell efficiency loss. The
identification and characterization of these defects are critical steps in the process of …