[HTML][HTML] Research status and development trend of MEMS switches: A review

T Cao, T Hu, Y Zhao - Micromachines, 2020 - mdpi.com
MEMS switch is a movable device manufactured by means of semiconductor technology,
possessing many incomparable advantages such as a small volume, low power …

Capacitive RF MEMS switch dielectric charging and reliability: a critical review with recommendations

WM Van Spengen - Journal of Micromechanics and …, 2012 - iopscience.iop.org
This paper presents a comprehensive review of the reliability issues hampering capacitive
RF MEMS switches in their development toward commercialization. Dielectric charging and …

Migration of adhesive material in electrostatically actuated MEMS switch

IV Uvarov - Microelectronics Reliability, 2021 - Elsevier
Microelectromechanical systems (MEMS) switches are attractive for many applications
including radio frequency and microwave systems, logic devices, acceleration sensing and …

Reliability issue related to dielectric charging in capacitive micromachined ultrasonic transducers: A review

J Munir, Q Ain, HJ Lee - Microelectronics Reliability, 2019 - Elsevier
The long-term reliability of MEMS devices related to the dielectric charging phenomenon is
one of the main hurdles in the commercialization of these devices. This paper presents a …

A study of field emission current in MEMS capacitors with bottom electrode covered by dielectric film

J Theocharis, D Birmpiliotis, S Gardelis… - Microelectronics …, 2023 - Elsevier
The potential distribution in a MEMS capacitor with a thin dielectric film on the bottom
electrode and under the presence of field emission leakage current is presented for the first …

Stability of charge distributions in electret films on the nm-scale

S Gödrich, HW Schmidt… - ACS Applied Materials & …, 2022 - ACS Publications
Electret materials find use in various applications, such as microphones or filter media. In
recent years, electrets have been used also increasingly on the micrometer scale, for …

A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches

M Koutsoureli, L Michalas, A Gantis… - Microelectronics …, 2014 - Elsevier
The present paper aims to provide a better insight to the electrical characteristics of silicon
nitride films that have been deposited with PECVD method under different conditions. The …

A novel method for the assessment of surface charge density variance in capacitive RF-MEMS switches

D Birmpiliotis, M Koutsoureli, G Papaioannou - Microelectronics Reliability, 2021 - Elsevier
The present paper provides a novel, inexpensive and non-destructive method to assess the
surface charge density variance in capacitive RF-MEMS switches. The charge variance …

Effect of deposition gas ratio, RF power, and substrate temperature on the charging/discharging processes in PECVD silicon nitride films for electrostatic NEMS/MEMS …

U Zaghloul, GJ Papaioannou… - Journal of …, 2011 - ieeexplore.ieee.org
The dependence of the electrical properties of silicon nitride, which is a commonly used
dielectric in nano-and micro-electromechanical systems (NEMS and MEMS), on the …

Nanotribology, Nanomechanics and Materials Characterization Studies Using Scanning Probe Microscopy

B Bhushan, O Eminent, HD Winbigler - … and Nanomechanics: An …, 2017 - Springer
Nanotribology and nanomechanics studies are needed to develop a fundamental
understanding of interfacial phenomena on a small scale, and to study interfacial …