A simplified on-state voltage measurement circuit for power semiconductor devices

Y Peng, H Wang - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
This letter proposes a simplified converter-level on-state voltage measurement circuit for
power semiconductor devices, without an external power supply and self-power circuit. It …

Accurate condition monitoring of semiconductor devices in cascaded H-bridge modular multilevel converters

M Asoodar, M Nahalparvari, Y Zhang… - … on Power Electronics, 2022 - ieeexplore.ieee.org
This article presents an online condition monitoring (CM) scheme for semiconductors used
in modular multilevel converters (MMCs) that comprise cascaded H-bridge submodules. The …

An on-line calibration method for TSEP-based junction temperature estimation

Y Peng, Q Wang, H Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Temperature sensitive electrical parameters (TSEP) provide an indirect and noninvasive
method for on-line junction temperature estimation of power semiconductor devices. It is …

A fast on-state voltage measurement circuit for power devices characterization

L Rossetto, G Spiazzi - IEEE Transactions on Power Electronics, 2021 - ieeexplore.ieee.org
The precise measurement of the on-state voltage of power devices working in real operating
conditions is the key for their characterization as well as health monitoring. This letter …

Floating-reference on-state voltage measurement strategy for condition monitoring application

M Ghadrdan, S Peyghami, H Mokhtari… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Due to its acceptable sensitivity to aging, on-state voltage is one of the best degradation
indicators ever devised to monitor the condition of power semiconductors. The steep …

A unified open-circuit fault diagnosis and condition monitoring method for three-level T-type inverter

W Zhang, Y He, J Chen, B Du - IEEE Transactions on Power …, 2022 - ieeexplore.ieee.org
Traditional fault diagnosis (FD) and condition monitoring (CM) methods for three-level T-type
(3L-T) inverters are studied separately, which is not conducive to guaranteeing the reliability …

IoT-Aimed Health Monitoring Scheme for Power Semiconductor Devices Based on Mahalanobis Processing

Y Peng, S Zhao, H Wang - IEEE Internet of Things Journal, 2023 - ieeexplore.ieee.org
Health condition monitoring is critical to secure the availability and reliability of the power
semiconductor devices in power converter. Massive efforts have been devoted to the …

High Accuracy and Wide Temperature Range Converter-level On-state Voltage Measurement with Localization Function for SiC MOSFETs

Q Wu, S Shen, H Zhang, Q Wang - IEEE Transactions on Power …, 2024 - ieeexplore.ieee.org
Condition monitoring technology can significantly improve system reliability by monitoring
the device degradation process in real-time and implementing predictive maintenance. On …

电压源型并网变流器状态监测与故障诊断方法综述

宋少鹏, 田艳军, 李欣, 徐小奇 - 电气工程学报, 2024 - jgcm.ac.cn
电压源型变流器(Voltage source converter, VSC) 广泛应用于分布式发电和储能单元等并网
领域中, VSC 系统严重影响并网系统的稳定运行. 开发并网VSC 潜在故障的健康状态监测和早期 …

Junction Temperature Estimation Technologies of IGBT Modules in Converter-Based Applications

S Tan, B Wei, JC Vasquez… - IECON 2023-49th Annual …, 2023 - ieeexplore.ieee.org
Insulated Gate Bipolar Transistor modules, known as IGBT modules, play a critical and
indispensable role in a wide range of power converter applications. However, IGBT modules …