The current status and trends of 1,200-V commercial silicon-carbide MOSFETs: Deep physical analysis of power transistors from a designer's perspective

AO Adan, D Tanaka, L Burgyan… - IEEE Power Electronics …, 2019 - ieeexplore.ieee.org
There is continuous activity to increase the efficiency and reduce the size of power electronic
systems and modules developed for transportation and automotive electrification …

A review of power electronic devices for heavy goods vehicles electrification: Performance and reliability

O Alatise, A Deb, E Bashar, J Ortiz Gonzalez, S Jahdi… - Energies, 2023 - mdpi.com
This review explores the performance and reliability of power semiconductor devices
required to enable the electrification of heavy goods vehicles (HGVs). HGV electrification …

SiC power MOSFETs performance, robustness and technology maturity

A Castellazzi, A Fayyaz, G Romano, L Yang… - Microelectronics …, 2016 - Elsevier
Abstract Relatively recently, SiC power MOSFETs have transitioned from being a research
exercise to becoming an industrial reality. The potential benefits that can be drawn from this …

A short-circuit safe operation area identification criterion for SiC MOSFET power modules

PD Reigosa, F Iannuzzo, H Luo… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper proposes a new method for the investigation of the short-circuit safe operation
area (SCSOA) of state-of-the-art SiC MOSFET power modules rated at 1.2 kV based on the …

A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations

M Riccio, V d'Alessandro, G Romano… - … on power electronics, 2017 - ieeexplore.ieee.org
This paper presents a temperature-dependent SPICE model for SiC power MOSFETs. The
model describes the static and dynamic behavior and accounts for leakage current and …

Degradation of SiC MOSFETs under high-bias switching events

JP Kozak, R Zhang, J Liu, KDT Ngo… - IEEE Journal of …, 2021 - ieeexplore.ieee.org
Evaluating the robustness of power semiconductor devices is key for their adoption into
power electronics applications. Recent static acceleration tests have revealed that SiC metal …

Investigations on the degradation of 1.2-kV 4H-SiC MOSFETs under repetitive short-circuit tests

X Zhou, H Su, Y Wang, R Yue, G Dai… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
The long-term operational reliability of silicon carbide (SiC) MOSFETs needs to be further
verified before they could replace silicon counterparts in power applications. In this paper …

Short-circuit degradation of 10-kV 10-A SiC MOSFET

EP Eni, S Bęczkowski, S Munk-Nielsen… - … on Power Electronics, 2017 - ieeexplore.ieee.org
The short-circuit behavior of power devices is highly relevant for converter design and fault
protection. In this paper, the degradation during short circuit of a 10-kV 10-A 4H-SiC …

Comparison and analysis of short circuit capability of 1200V single-chip SiC MOSFET and Si IGBT

J Sun, H Xu, X Wu, K Sheng - 2016 13th China International …, 2016 - ieeexplore.ieee.org
Short circuit capability of commercial SiC MOSFETs is analyzed, which is compared with that
of commercial Si IGBTs. Junction temperatures during short circuit tests are analyzed in this …

Comparison of short circuit failure modes in sic planar mosfets, sic trench mosfets and sic cascode jfets

E Bashar, R Wu, N Agbo, S Mendy… - 2021 IEEE 8th …, 2021 - ieeexplore.ieee.org
In this paper, a comprehensive comparative analysis is performed on the short circuit (SC)
withstand time and failure modes between a 650 V SiC Planar MOSFET, a 650 V SiC Trench …