Germanium CMOS potential from material and process perspectives: Be more positive about germanium

A Toriumi, T Nishimura - Japanese Journal of Applied Physics, 2017 - iopscience.iop.org
CMOS miniaturization is now approaching the sub-10 nm level, and further downscaling is
expected. This size scaling will end sooner or later, however, because the typical size is …

A review of thermal processing in the subsecond range: semiconductors and beyond

L Rebohle, S Prucnal, W Skorupa - Semiconductor Science and …, 2016 - iopscience.iop.org
Thermal processing in the subsecond range comprises modern, non-equilibrium annealing
techniques which allow various material modifications at the surface without affecting the …

[HTML][HTML] Germanium monolayer doping: successes and challenges for the next generation Ge devices

F Sgarbossa - Materials Science in Semiconductor Processing, 2023 - Elsevier
The growing interest in nanoelectronics and photonics, combined with the development of
new germanium-based devices, provide the impetus to develop new doping methods …

Doping by flash lamp annealing

S Prucnal, L Rebohle, W Skorupa - Materials Science in Semiconductor …, 2017 - Elsevier
After a short introduction we will highlight processing issues (setup, comparison of
annealing methods, relevant requirements for annealing due to doping, diffusion, activation …

Doping of semiconductor devices by Laser Thermal Annealing

K Huet, F Mazzamuto, T Tabata… - Materials Science in …, 2017 - Elsevier
In today's highly competitive semiconductor industry, and due to the accelerating pace of
technology development, the integration of new and disruptive solutions to address process …

Theoretical study of the laser annealing process in FinFET structures

SF Lombardo, G Fisicaro, I Deretzis, A La Magna… - Applied Surface …, 2019 - Elsevier
In this paper we present a computational tool for the simulation of laser annealing processes
in FinFET structures. This is a complex self-consistent problem, where heating is evaluated …

N-type heavy doping with ultralow resistivity in Ge by Sb deposition and pulsed laser melting

C Carraro, R Milazzo, F Sgarbossa, D Fontana… - Applied Surface …, 2020 - Elsevier
The fabrication of highly doped and high quality Ge layers is a challenging and hot topic for
advancements in nanoelectronics, photonics and radiation detectors. In this article, we …

Defect evolution and dopant activation in laser annealed Si and Ge

F Cristiano, M Shayesteh, R Duffy, K Huet… - Materials Science in …, 2016 - Elsevier
Defect evolution and dopant activation are intimately related to the use of ion implantation
and annealing, traditionally used to dope semiconductors during device fabrication. Ultra …

Optimized laser thermal annealing on germanium for high dopant activation and low leakage current

M Shayesteh, D O'Connell, F Gity… - … on Electron Devices, 2014 - ieeexplore.ieee.org
In this paper, state-of-the-art laser thermal annealing is used to fabricate Ge diodes. We
compared the effect of laser thermal annealing (LTA) and rapid thermal annealing (RTA) on …

The cm Electron Concentration and Low Specific Contact Resistivity of Phosphorus-Doped Ge on Si by In-Situ Chemical Vapor Deposition Doping and …

SH Huang, FL Lu, WL Huang… - IEEE Electron Device …, 2015 - ieeexplore.ieee.org
The phosphorus incorporation by chemical vapor deposition and activation by laser
annealing reaches the electron concentration of cm. The pulsed laser not only activates the …