Overview of real-time lifetime prediction and extension for SiC power converters

Z Ni, X Lyu, OP Yadav, BN Singh… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Remaining useful lifetime prediction and extension of Si power devices have been studied
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …

Methods of fast analysis of DC–DC converters—A review

P Górecki, K Górecki - Electronics, 2021 - mdpi.com
The paper discusses the methods of fast analysis of DC–DC converters dedicated to
computer programmes. Literature methods of such an analysis are presented, which enable …

[HTML][HTML] Open-cell aluminum foams with bimodal pore size distributions for emerging thermal management applications

FÇ Durmus, LP Maiorano, JM Molina - … Journal of Heat and Mass Transfer, 2022 - Elsevier
Recent advances in cellular materials for active thermal management applications involve
the integral design of their porous structure. In this work, open-cell aluminum foams with …

Junction temperature estimation of a SiC MOSFET module for 800V high-voltage application in electric vehicles

Z Shuai, S He, Y Xue, Y Zheng, J Gai, Y Li, G Li, J Li - Etransportation, 2023 - Elsevier
Abstract Silicon Carbide (SiC) power devices have significant advantages on power density
and energy efficiency, and are widely accepted as promising solutions for future electric …

A fast IGBT junction temperature estimation approach based on ON-state voltage drop

Y Yang, Q Zhang, P Zhang - IEEE Transactions on Industry …, 2020 - ieeexplore.ieee.org
Insulated gate bipolar transistor (IGBT) module is the most widely used power electronic
device in converters. Condition monitoring of IGBT is critical for avoiding sudden failures …

Robustness of 650-V enhancement-mode GaN HEMTs under various short-circuit conditions

H Li, X Li, X Wang, X Lyu, H Cai… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
This paper presents the short-circuit behavior and degradation of 650-V/60-A enhancement-
mode Gallium nitride (GaN) high electron mobility transistors (HEMTs) under various test …

[PDF][PDF] IGBT 模块寿命评估研究综述

张军, 张犁, 成瑜 - TRANSACTIONS OF CHINA …, 2021 - dgjsxb.ces-transaction.com
摘要绝缘栅双极型晶体管(IGBT) 是电力电子系统实现电能变换与控制的核心组件之一. 然而,
工业界反馈的数据表明, 应用于高可靠性场合的IGBT 模块可靠性并不高, 其热疲劳失效将会导致 …

A temperature-dependent Cauer model simulation of IGBT module with analytical thermal impedance characterization

X Yang, K Heng, X Dai, X Wu… - IEEE Journal of Emerging …, 2021 - ieeexplore.ieee.org
In pursuit of high power density and high reliability of power converters, the junction
temperature of power devices becomes an essential indicator for heath condition monitoring …

Measurements of parameters of the thermal model of the IGBT module

K Górecki, P Górecki, J Zarębski - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
In this paper, the problem of how to describe the thermal properties of the insulated-gate
bipolar transistor (IGBT) module with the use of the compact thermal model is considered …

A physics-based improved cauer-type thermal equivalent circuit for IGBT modules

Z Wang, W Qiao - IEEE Transactions on Power Electronics, 2016 - ieeexplore.ieee.org
A physics-based Cauer-type thermal equivalent circuit (TEC) can be constructed for an
insulated-gate bipolar transistor (IGBT) module based on its geometry. In the conventional …