Linear characterization and modeling of GaN-on-Si HEMT technologies with 100 nm and 60 nm gate lengths
Motivated by the growing interest towards low-cost, restriction-free MMIC processes suitable
for multi-function, possibly space-qualified applications, this contribution reports the …
for multi-function, possibly space-qualified applications, this contribution reports the …
Causal characteristic impedance determination using calibration comparison and propagation constant
S Amakawa, A Takeshige, S Hara… - 2019 92nd ARFTG …, 2019 - ieeexplore.ieee.org
It is common to determine the characteristic impedance Z_0 of a low-loss transmission line
using the measured propagation constant γ through Z_0=γ/(G+jωC), assuming that the …
using the measured propagation constant γ through Z_0=γ/(G+jωC), assuming that the …
Transmission line impedance characterization using an uncalibrated vector network analyzer
JA Reynoso-Hernández… - IEEE Microwave and …, 2020 - ieeexplore.ieee.org
For determining the line characteristic impedance Z 1 of uniform transmission lines, it is
typically necessary to use a calibrated vector network analyzer (VNA), whose calibration …
typically necessary to use a calibrated vector network analyzer (VNA), whose calibration …
[图书][B] Principles and Applications of Vector Network Analyzer Calibration Techniques
JAR Hernández, MAP Gaytan - 2024 - books.google.com
This book summarizes the work developed over more than two decades in the field of
advanced calibration techniques for vector network analyzers, by the RF and Microwave …
advanced calibration techniques for vector network analyzers, by the RF and Microwave …