Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

A methodology for efficient tolerance analysis of electronic circuits based on nonsampling
stochastic simulation of transients is formulated, implemented, and validated. We model the …

This paper presents a multiparameter moment-matching-based model order reduction
technique for parameterized interconnect networks via a novel two-directional Arnoldi …

Ring oscillators are not new, but the authors of this article use them in a novel,
unconventional way to monitor process variation at different regions of a die in the frequency …

In this paper, a spectral stochastic collocation method (SSCM) is proposed for the
capacitance extraction of interconnects with stochastic geometric variations for nanometer …

Recent works have shown that multi-modal biometric systems are not robust against
spoofing attacks [12, 15, 13]. However, this conclusion has been obtained under the …

In this paper, stochastic collocation algorithm combined with sparse grid technique (SSCA)
is proposed to deal with the periodic steady-state analysis for nonlinear systems with …

This paper solves the variation-aware decoupling capacitance (decap) budgeting problem.
Unlike previous works which only consider worst case design, for the first time, we consider …

This paper proposes a novel stochastic method for analyzing the voltage drop variations of
on-chip power grid networks, considering lognormal leakage current variations. The new …

Since process variation and chip performance uncertainties have become more pronounced
as technologies scale down into the nanometer regime, accurate and efficient modeling or …