Trends in semiconductor defect engineering at the nanoscale

EG Seebauer, KW Noh - Materials Science and Engineering: R: Reports, 2010 - Elsevier
Defect engineering involves manipulating the type, concentration, spatial distribution, or
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …

[图书][B] Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy

JD Cressler, S Monfray, G Freeman, D Friedman… - 2018 - taylorfrancis.com
An extraordinary combination of material science, manufacturing processes, and innovative
thinking spurred the development of SiGe heterojunction devices that offer a wide array of …

[HTML][HTML] 3D to 2D perspectives-Traditional and new doping and metrology challenges at the nanoscale

M Georgieva, N Petkov, R Duffy - Materials Science in Semiconductor …, 2023 - Elsevier
In this perspectives paper we will explore the doping state-of-the-art as it evolves for 3D to
2D structures and materials, and the following impact on the metrology methods needed to …

Laser annealing in CMOS manufacturing

O Gluschenkov, H Jagannathan - ECS Transactions, 2018 - iopscience.iop.org
Laser Annealing was introduced into mainstream CMOS manufacturing nearly a decade
ago and since then has been evolving capturing new applications and expanding into new …

Diagnosis of phosphorus monolayer doping in silicon based on nanowire electrical characterisation

R Duffy, A Ricchio, R Murphy, G Maxwell… - Journal of Applied …, 2018 - pubs.aip.org
The advent of high surface-to-volume ratio devices has necessitated a revised approach to
parameter extraction and process evaluation in field-effect transistor technologies. In this …

Deactivation of ultrashallow boron implants in preamorphized silicon after nonmelt laser annealing with multiple scans

JA Sharp, NEB Cowern, RP Webb, KJ Kirkby… - Applied physics …, 2006 - pubs.aip.org
Electrical activation and redistribution of 500 eV boron implants in preamorphized silicon
after nonmelt laser annealing at 1150 C and isochronal rapid thermal postannealing are …

Quantitative prediction of junction leakage in bulk-technology CMOS devices

R Duffy, A Heringa, VC Venezia, J Loo… - Solid-State …, 2010 - Elsevier
Junction leakage becomes more significant as metal-oxide-semiconductor (MOS)
technologies scale down in bulk-silicon. In this work we quantify the four key elements to …

[HTML][HTML] Leakage current analysis of silicon diode with anode activated by furnace annealing or laser annealing using deep level transient spectroscopy

H Wakimoto, T Matsumoto, K Yano, T Muranaka - aip advances, 2020 - pubs.aip.org
Silicon PiN diodes with ap+ region in the anode—where boron atoms are implanted and
activated with relatively low-temperature furnace annealing (FA) or high-temperature laser …

Rapid thermal processing

PJ Timans, R Sharangpani, RPS Thakur… - … Technology, Y. Nishi …, 2000 - books.google.com
Rapid thermal processing (RTP) is a key technology in the fabrication of advanced
integrated circuits, with a wide range of applications, including titanium silicide and nitride …

Rapid thermal processing for silicon nanoelectronics applications

AT Fiory - JOM, 2005 - Springer
Single-wafer rapid thermal processing, which has become indispensable in the present-day
manufacture of integrated circuits, has replaced batch furnace processing to satisfy device …