Illumination for optical scan and measurement

KA Blanton, K Hatzilias, ST Posey… - US Patent 8,841,603, 2014 - Google Patents
Optical scanning with an optical probe composed of an elon gated cylinder of transparent
material mounted upon an opti cal scanner body; one or more sources of scan illumination …

Measuring individual data of spectacles

C Glasenapp, M Hornauer - US Patent 10,520,390, 2019 - Google Patents
An apparatus and a method for measuring individual data of spectacles arranged in a
measurement position are disclosed. The spectacles have a left and/or a right spectacle …

Method for zero-contact measurement of topography

T Tschudi, B Braunecker - US Patent 8,908,191, 2014 - Google Patents
Claude AS Hamrick (57) ABSTRACT A method for Zero-contact measurement of the
topography of a spherically or aspherically curved air-glass Surface of an optical lens or lens …

Measuring probe for non-destructive measuring of the thickness of thin layers

H Fischer - US Patent 9,074,880, 2015 - Google Patents
The invention relates to a measuring probe for non-destructive measuring of the thickness of
thin layers, in particular in cavities, which are accessible by an opening or on curved …

Measuring probe for non-destructive measuring of the thickness of thin layers

H Fischer - US Patent 9,857,171, 2018 - Google Patents
The invention relates to a measuring probe for non-destructive measuring of the thickness of
thin layers on an object with a measuring head, which comprises at least one sensor …

Optical measurement of drilled holes

H Bergman, HI Christensen, K Hatzilias - US Patent 8,842,273, 2014 - Google Patents
BACKGROUND Much manufacturing today, particularly aerospace manu facturing,
particularly during manufacture of commercial air craft, hundreds of thousands of precisely …

Calibrating jig, profile measuring device, and method of offset calculation

M Yamagata, Y Takahama, H Ishiyama… - US Patent …, 2013 - Google Patents
To achieve the above-described object, a calibrating jig in accordance with a first aspect of
the present invention com prises: a reference sphere; and a reflecting plate configured to …

Surface shape measurement apparatus

R Sato - US Patent 8,411,280, 2013 - Google Patents
One aspect of the present invention provides a Surface shape measurement apparatus
advantageous in high-preci sion Surface shape measurement. One aspect of the present …

Calibration of an interferometer

L Robledo, P Kesselring - US Patent 10,330,461, 2019 - Google Patents
In a method for calibrating an interferometer (100) having a beam path for a measuring
beam (112), wherein at least one plane (320) that at least partially reflects the measuring …

Calibrating jig, profile measuring device, and method of offset calculation

M Yamagata, Y Takahama, H Ishiyama… - US Patent …, 2012 - Google Patents
US8139229B2 - Calibrating jig, profile measuring device, and method of offset calculation -
Google Patents US8139229B2 - Calibrating jig, profile measuring device, and method of offset …