The use of X-ray and neutron reflectivity has been generalized worldwide for scientists who
want to determine specific physical properties (such as electron-density profile, scattering …

Resonant soft X-ray scattering (R-SoXS) has proven to be a highly useful technique for
studying the morphology of soft matter thin films due to the large intrinsic contrast between …

The use of soft X-rays near the carbon absorption edge (∼ 270–300 eV) for small angle X-
ray scattering and X-ray reflectivity experiments has significantly expanded the scientific …

In the present work, formation of interfaces in the multilayer periodic Mo/Be mirror was
studied using X-ray photoelectron spectroscopy. Chemical composition and significance of …

Fine structure features of energy‐dependent atomic scattering factor near the atomic
absorption edge, are used for structural analysis of low‐Z containing thin film structures. The …

Resonant soft X-ray reflectivity at the carbon K edge, with linearly polarized light, was used
to derive quantitative information of film morphology, molecular arrangement, and electronic …

We report soft x-ray reflectivity measurements near the Si L 2, 3 absorption edge for Si-rich
silicon nitride thin film obtained by Hg-sensitized photochemical vapor deposition. We …

ABSTRACT Mg/Sc and Sc/Mg bilayers were studied to investigate their interfaces. Time-of-
flight secondary ion mass spectroscopy and grazing incidence x-ray reflectivity are …

The evolution of residual stress and its correlation with microstructure are investigated
systematically in nano-scaled periodic W/B4C multilayers (MLs) as a function of individual …

A systematic study of structure and thermal stability of a [(Mo/Y/) x 5] soft x-ray multilayer
(ML) mirror prepared by electron beam evaporation system has been performed by means …