In Situ Poly Heater—A Reliable Tool for Performing Fast and Defined Temperature Switches on Chip

T Aichinger, M Nelhiebel, S Einspieler… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
In this paper, we discuss the calibration procedure and performance of the poly-heater
measurement technique for device characterization and reliability issues. We put a particular …

Temperature distribution measurement of Au micro-heater in microfluidic channel using IR microscope

JM Son, JH Lee, J Kim, YH Cho - International Journal of Precision …, 2015 - Springer
The temperature control and measurement of micro-heater in microfluidic devices are very
essential in various application fields such as gas sensors, flow sensors and bio-sensors. In …

A novel setup for in situ monitoring of thermomechanically cycled thin film metallizations

S Moser, G Zernatto, M Kleinbichler, M Nelhiebel… - JOM, 2019 - Springer
A novel experimental setup is presented to thermomechanically cycle metallizations in situ
and, at the same time, study the progress of gradual changes in their microstructure using …

A measurement structure for in-situ electrical monitoring of cyclic delamination

S Moser, D Tscharnuter, M Nelhiebel… - Surface and Coatings …, 2022 - Elsevier
Cyclic delamination is the root cause for many different failure modes in semiconductor
devices that are related to a loss of mechanical, electrical, or thermal contact. Some of them …

Fatigue of copper films subjected to high-strain rate thermo-mechanical pulsing

S Moser, M Kleinbichler, J Zechner, M Reisinger… - Microelectronics …, 2022 - Elsevier
During service in power electronic applications, microelectronic chips encounter rapid
changes in temperature, which are manifested by sub-millisecond-short heat pulses with …

[图书][B] High resolution thermoreflectance imaging of power transistors and nanoscale percolation networks

K Maize - 2014 - search.proquest.com
Performance, efficiency, and reliability of modern high power, high speed microelectronics
and nanoscale structures are strongly influenced by device self-heating on the micron and …

Electrothermal multiscale modeling and simulation concepts for power electronics

H Köck, S Eiser, M Kaltenbacher - IEEE Transactions on Power …, 2015 - ieeexplore.ieee.org
This paper presents a finite-element-based simulation methodology to improve on
multiscale modeling and analysis limitations of power electronics development. The method …

Thermal issues in microelectronics

X Perpiñà, M Vellvehi, X Jordà - 2015 - books.rsc.org
Electronic systems are present in our everyday lives. In many applications, they have
complemented or replaced functions performed by other systems based on mechanic …

Application of on-chip device heating for BTI investigations

T Aichinger, G Pobegen, M Nelhiebel - Bias Temperature Instability for …, 2013 - Springer
This chapter introduces a new experimental approach allowing to switch the temperature of
a device in a very fast and defined way. The new hardware tool, which we will herein refer to …

[PDF][PDF] High-Resolution Thermoreflectance Imaging of GaN Power Microwave Transistors

C Matei, P Aaen, D Kending - ARMMS RF & …, 2017 - openresearch.surrey.ac.uk
This paper presents CCD based thermoreflectance measurements of surface temperatures
with submicron spatial resolution and 50 ns temporal resolution. The measurement results …