An overview of transmission/reflection-based methods for the electromagnetic
characterisation of materials is presented. The paper initially describes the most popular …

A simple and accurate method to measure the complex sheet impedance of thin conductive
films on dielectric substrates is reported. This method allows for accurate extraction of the …

A two-port coaxial probe is introduced to nondestructively determine the permittivity tensor of
a uniaxial material. The proposed approach possesses several advantages over existing …

A simple approach to estimate the surface impedance of a thin ink deposition on dielectric
substrates is described. The measured sample is transversally accommodated in a …

We present a dynamically tunable metamaterial graphene absorber (MGA) in the terahertz
regime. The unit cell of the proposed MGA consists of metal wire and graphene sheet over …

We propose a broadband conductivity measurement method in the millimeter-wave bands
using a balanced-type circular disk resonator (BCDR). Because of the unique feature of the …

The photoinduced microwave complex permittivity of a highly resistive single-crystal silicon
wafer was extracted from a bistatic free-space characterization test bench operating in the …

A transmission/reflection material characterization technique that uses dual-ridged
waveguides is presented. The proposed dual-ridged-waveguide system combines many of …

Understanding and manipulation of surface impedance in graphene hybrid structure is a
significant issue for applications of graphene-based optoelectronics devices. In order to …

A novel two-port probe which uses dual-ridged waveguides for the nondestructive,
broadband characterization of sheet materials is presented. The new probe is shown to …