Application of scanning probe microscopy to the characterization and fabrication of hybrid nanomaterials
ME Greene, CR Kinser, DE Kramer… - Microscopy …, 2004 - Wiley Online Library
Scanning probe microscopy (SPM) is a widely used experimental technique for
characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to …
characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to …
Round-robin measurements of 100-and 60-nm scales among a deep-ultraviolet laser diffractometer, a scanning electron microscope and various atomic force …
I Misumi, S Gonda, O Sato, M Yasutake… - Measurement …, 2007 - iopscience.iop.org
An intercomparison of nanometric lateral scales, which are special one-dimensional (1D)
grating standards with sub-hundred-nanometre pitches, among a deep-ultraviolet (DUV) …
grating standards with sub-hundred-nanometre pitches, among a deep-ultraviolet (DUV) …
Development of an apertureless near-field optical microscope for nanoscale optical imaging at low temperatures
K Taniguchi, Y Kanemitsu - Japanese journal of applied physics, 2005 - iopscience.iop.org
We have developed an apertureless scanning near-field optical microscope (apertureless
SNOM) operating at low temperatures. The apertureless SNOM system is based on the …
SNOM) operating at low temperatures. The apertureless SNOM system is based on the …
Nanometer scale x-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on silicon using electrostatic force microscopy
M Ishii, B Hamilton, NRJ Poolton, N Rigopoulos… - Applied physics …, 2007 - pubs.aip.org
Electrostatic force microscopy (EFM) was used to obtain highly spatially resolved
spectroscopic and image information of semiconductor surface region. EFM with x-ray …
spectroscopic and image information of semiconductor surface region. EFM with x-ray …
Electron trapping at the Si (111) atomic step edge
M Ishii, B Hamilton - Applied physics letters, 2004 - pubs.aip.org
We have investigated the charge distribution at the interface between the Si (111) wafer and
its native oxide by Kelvin force microscopy (KFM) with excitation from a He–Cd laser source …
its native oxide by Kelvin force microscopy (KFM) with excitation from a He–Cd laser source …
Guide to the Literature of Piezoelectricity and Pyroelectricity. 24
SB Lang - Ferroelectrics, 2005 - Taylor & Francis
A bibliography is given containing 1911 references published during 2003 on piezoelectric
and pyroelectric properties of materials and their applications. It contains listings of journal …
and pyroelectric properties of materials and their applications. It contains listings of journal …
Near-field light detection by conservative and dissipative force modulation methods using a piezoelectric cantilever
We demonstrated near-field light detection by dynamic force microscope using a self-
sensing piezoelectric cantilever having a lead zirconate titanate thin film layer. The …
sensing piezoelectric cantilever having a lead zirconate titanate thin film layer. The …
Calculation of Hysteresis Losses for Ferroelectric Soft Lead Zirconate Titanate Ceramics
MA Hamad - Journal of electronic materials, 2014 - Springer
The phenomenological Hamad model was modified to enable retracing of the hysteresis
loop of ferroelectric soft lead zirconate titanate (PZT). Comparison with experimental results …
loop of ferroelectric soft lead zirconate titanate (PZT). Comparison with experimental results …
Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy
M Ishii, B Hamilton, N Poolton - Journal of Applied Physics, 2008 - pubs.aip.org
We have observed the distribution of electron trapping centers on distorted carbon
nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial …
nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial …
Investigations of nanoparticles by scanning near-field optical microscopy combined with Kelvin probe force microscopy using a piezoelectric cantilever
N Satoh, K Kobayashi, S Watanabe… - Japanese journal of …, 2004 - iopscience.iop.org
A microfabricated cantilever with a lead zirconate titanate (PZT) piezoelectric thin film used
as an integrated deflection sensor was applied to dynamic-mode atomic force microscopy …
as an integrated deflection sensor was applied to dynamic-mode atomic force microscopy …