An optomechanical force sensor includes a substrate, a cantilevered beam anchored to the
substrate, and a probe tip positioned near an end of the cantilevered beam distal to the …

A new monolithic Atomic Force Microscopy (AFM) active optical probe monolithically
integrates a base of the probe, a cantilever, a semiconductor laser source, an AFM tip, and a …

Actoprobe team had developed custom Tip Enhancement Raman Spectroscopy System
(TERS) with specially developed Ultra High Aspect Ratio probes for AFM and TERS …

(57) ABSTRACT A heterogeneous semiconductor structure, including a first integrated circuit
and a second integrated circuit, the second integrated circuit being a photonic integrated …

A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe
integrates a semiconductor laser source and an aperture AFM/near-field scanning optical …

Abstract A new integrated III-V/silicon Atomic Force Microscopy (AFM) active optical probe
integrates a III-V semiconductor laser source and a silicon cantilever AFM probe into a …

US20220357360A1 - Semiconductor-laser-integrated atomic force microscopy optical
probe - Google Patents US20220357360A1 - Semiconductor-laser-integrated atomic force …

A heterogeneous semiconductor structure, including a first integrated circuit and a second
integrated circuit, the second integrated circuit being a photonic integrated circuit. The …

(57) ABSTRACT A probe assembly for a surface analysis instrument such as an atomic force
microscope (AFM) that accommodates potential thermal drift effects includes a substrate …

Actoprobe team had developed custom Tip Enhancement Raman Spectroscopy System
(TERS) with specially developed Ultra High Aspect Ratio probes for AFM and TERS …