Influence of Sample and Ion Beam potential on the Mirror Effect phenomenon at Low accelerated Voltage

MJ Zoory, EH Ahmed - IOP Conference Series: Materials …, 2018 - iopscience.iop.org
Here, the behavior of scanning ion was treated by a simple mathematical control as a
function of beam potential and sample potential. The motion equation of the vertically …

Electron-Beam Reflection Investigation Concerning Charged Disc and Multipole Approximations.

TH Abbood, HN Al-Obaidi, AS Mahdi… - Mathematical …, 2024 - search.ebscohost.com
The influence of the surface sample potential on the head-incident electron beam in the
scanning electron microscope has been studied in terms of the mirror effect. The multipole …

[PDF][PDF] Mathematical Modelling of Engineering Problems

AM Abd, RN Zehawi, RH Ali - Journal homepage: http://iieta. org …, 2024 - researchgate.net
A useful tool for non-linear multivariable modelling is the Artificial Neural Network (ANN).
Cost-effectiveness has been demonstrated for the use of ANN. Typically, the neural network …