One means by which the security of Internet-of-Things (IoT)-enabled devices may be
augmented is through radio-frequency fingerprinting-based authentication methods. As …

One of the threats to nanometric CMOS analog circuit reliability is circuit performance
degradation due to transistor aging. To extend circuit operating life, the bias of the main …

Based on S-parameter measurements, the effect of dynamic trapping and de-trapping of
charge in the gate oxide, the increase of dielectric loss due to polarization, and the impact of …

Power Amplifier (PA) is a key component for embedded RF/mmWave on advanced CMOS
technologies on the way to replace the III/V technologies. PA reliability has been a long …

An adaptive bias strategy is proposed to harden fully integrated CMOS RF power amplifiers
against time-dependent parametric degradation due to hot carrier injection. PA transistor DC …

Las tecnologías de integración de circuitos nanoelectrónicos basadas en silicio se acercan
al límite de su evolución. La introducción de nuevos materiales para los dispositivos de …

Device level reliability is introduced into simulations of an optimized all-NMOSFET, cross-
coupled, radiofrequency Voltage Controlled Oscillator to trace the sensitive devices and …