Prospects of III-nitride optoelectronics grown on Si

D Zhu, DJ Wallis, CJ Humphreys - Reports on Progress in …, 2013 - iopscience.iop.org
The use of III-nitride-based light-emitting diodes (LEDs) is now widespread in applications
such as indicator lamps, display panels, backlighting for liquid-crystal display TVs and …

Green gap in GaN-based light-emitting diodes: in perspective

M Usman, M Munsif, U Mushtaq, AR Anwar… - Critical Reviews in …, 2021 - Taylor & Francis
Significant progress has been made in the advancement of light-emitting devices in both the
blue and the red parts of the emission spectrum. However, the quantum efficiency of green …

Tunable optoelectronic and ferroelectric properties in Sc-based III-nitrides

S Zhang, D Holec, WY Fu, CJ Humphreys… - Journal of applied …, 2013 - pubs.aip.org
Sc-based III-nitride alloys were studied using density functional theory with special quasi-
random structure methodology. Sc x Al 1− x N and Sc x Ga 1− x N alloys are found to be …

Atomistic analysis of the impact of alloy and well-width fluctuations on the electronic and optical properties of InGaN/GaN quantum wells

S Schulz, MA Caro, C Coughlan, EP O'Reilly - Physical Review B, 2015 - APS
We present an atomistic description of the electronic and optical properties of In 0.25 Ga
0.75 N/GaN quantum wells. Our analysis accounts for fluctuations of well width, local alloy …

Three-dimensional mapping of quantum wells in a GaN/InGaN core–shell nanowire light-emitting diode array

JR Riley, S Padalkar, Q Li, P Lu, DD Koleske… - Nano …, 2013 - ACS Publications
Correlated atom probe tomography, cross-sectional scanning transmission electron
microscopy, and cathodoluminescence spectroscopy are used to analyze InGaN/GaN …

Disorder effects in nitride semiconductors: impact on fundamental and device properties

C Weisbuch, S Nakamura, YR Wu, JS Speck - Nanophotonics, 2020 - degruyter.com
Semiconductor structures used for fundamental or device applications most often
incorporate alloy materials. In “usual” or “common” III–V alloys, based on the InGaAsP or …

Atom Probe Tomography of a-Axis GaN Nanowires: Analysis of Nonstoichiometric Evaporation Behavior

JR Riley, RA Bernal, Q Li, HD Espinosa, GT Wang… - ACS …, 2012 - ACS Publications
GaN nanowires oriented along the nonpolar a-axis were analyzed using pulsed laser atom
probe tomography (APT). Stoichiometric mass spectra were achieved by optimizing the …

Excitons in a disordered medium: A numerical study in InGaN quantum wells

A David, C Weisbuch - Physical Review Research, 2022 - APS
Excitons in InGaN quantum wells are investigated numerically, considering random alloy
disorder and Coulomb interaction on equal footing in the Schrödinger equation. Their …

Unintentional doping in GaN

T Zhu, RA Oliver - Physical Chemistry Chemical Physics, 2012 - pubs.rsc.org
The optimisation of GaN-based electronic and optoelectronic devices requires control over
the doping of the material. However, device performance, particular for lateral transport …

Carrier localization in the vicinity of dislocations in InGaN

F Massabuau, P Chen, MK Horton, SL Rhode… - Journal of Applied …, 2017 - pubs.aip.org
We present a multi-microscopy study of dislocations in InGaN, whereby the same threading
dislocation was observed under several microscopes (atomic force microscopy, scanning …