Highly indistinguishable photons from deterministic quantum-dot microlenses utilizing three-dimensional in situ electron-beam lithography

M Gschrey, A Thoma, P Schnauber, M Seifried… - Nature …, 2015 - nature.com
The success of advanced quantum communication relies crucially on non-classical light
sources emitting single indistinguishable photons at high flux rates and purity. We report on …

Resolution and alignment accuracy of low-temperature in situ electron beam lithography for nanophotonic device fabrication

M Gschrey, R Schmidt, JH Schulze… - Journal of Vacuum …, 2015 - pubs.aip.org
The performance of a deterministic lithographic technology to produce a reliable and
accurate fabrication of nanophotonic devices based on epitaxial quantum dots is analyzed …

High-performance deterministic in situ electron-beam lithography enabled by cathodoluminescence spectroscopy

S Rodt, S Reitzenstein - Nano Express, 2021 - iopscience.iop.org
The application of solid-state quantum emitters in real-world quantum information
technologies requires precise nanofabrication platforms with high process yield. Self …

Advanced in-situ electron-beam lithography for deterministic nanophotonic device processing

A Kaganskiy, M Gschrey, A Schlehahn… - Review of Scientific …, 2015 - pubs.aip.org
We report on an advanced in-situ electron-beam lithography technique based on high-
resolution cathodoluminescence (CL) spectroscopy at low temperatures. The technique has …

Using low-contrast negative-tone PMMA at cryogenic temperatures for 3D electron beam lithography

P Schnauber, R Schmidt, A Kaganskiy, T Heuser… - …, 2016 - iopscience.iop.org
We report on a 3D electron beam lithography (EBL) technique using polymethyl
methacrylate (PMMA) in the negative-tone regime as a resist. First, we briefly demonstrate …

Electron beam damage of perfluorosulfonic acid studied by soft X-ray spectromicroscopy

LGA Melo, AP Hitchcock - Micron, 2019 - Elsevier
Scanning transmission X-ray microscopy (STXM) was used to study chemical changes to
perfluorosulfonic acid (PFSA) spun cast thin films as a function of dose imparted by …

CSAR 62 as negative-tone resist for high-contrast e-beam lithography at temperatures between 4 K and room temperature

A Kaganskiy, T Heuser, R Schmidt, S Rodt… - Journal of Vacuum …, 2016 - pubs.aip.org
The temperature dependence of the electron-beam sensitive resist CSAR 62 is investigated
in its negative-tone regime. The writing temperatures span a wide range from 4 K to room …

Bright single-photon sources based on anti-reflection coated deterministic quantum dot microlenses

P Schnauber, A Thoma, CV Heine, A Schlehahn… - Technologies, 2015 - mdpi.com
We report on enhancing the photon-extraction efficiency (PEE) of deterministic quantum dot
(QD) microlenses via anti-reflection (AR) coating. The AR-coating deposited on top of the …

Deterministic quantum devices for optical quantum communication

S Rodt, PI Schneider, L Zschiedrich, T Heindel… - … : Materials, Models, and …, 2020 - Springer
Photonic quantum technologies are based on the exchange of information via single
photons. The information is typically encoded in the polarization of the photons and security …

Single-photon sources based on deterministic quantum-dot microlenses

T Heindel, S Rodt, S Reitzenstein - Quantum Dots for Quantum Information …, 2017 - Springer
This chapter addresses the design, fabrication and characterization of deterministically
fabricated single-photon sources based on quantum dot microlenses. The quantum devices …