P Sharma, AK Gundu… - 2016 20th International …, 2016 - ieeexplore.ieee.org
Process variations have become a major challenge with the advancement in CMOS technologies. The performance of memory sub-systems such as Static Random Access …
N Batra, S Kaushik, AK Gundu… - 2016 29th IEEE …, 2016 - ieeexplore.ieee.org
With emerging deep submicron technology, device variations limit the SRAM performance and yield. Cell stability defined by the Static Noise Margin (SNM) of the SRAM cell among …
P Sharma, MS Hashmi - 2016 - repository.iiitd.edu.in
On chip process parameter variations have become a major challenge to meet the high density demands and the advancement in CMOS technologies. Variations in threshold …