Recent advances and new trends in flip chip technology

JH Lau - Journal of Electronic Packaging, 2016 - asmedigitalcollection.asme.org
Recent advances in flip chip technology such as wafer bumping, package substrate, flip chip
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …

Recent advances and trends in Cu–Cu hybrid bonding

JH Lau - IEEE Transactions on Components, Packaging and …, 2023 - ieeexplore.ieee.org
In this study, the recent advances and trends in Cu–Cu hybrid bonding will be investigated.
Emphasis is placed on the definition, kinds, advantages and disadvantages, challenges …

Overview and outlook of through‐silicon via (TSV) and 3D integrations

JH Lau - Microelectronics International, 2011 - emerald.com
Purpose–The purpose of this paper is to focus on through‐silicon via (TSV), with a new
concept that every chip or interposer could have two surfaces with circuits. Emphasis is …

Compact AC modeling and performance analysis of through-silicon vias in 3-D ICs

C Xu, H Li, R Suaya, K Banerjee - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
This paper introduces the first comprehensive and accurate compact resistance-inductance-
capacitance-conductance (RLCG) model for through-silicon vias (TSVs) in 3-D ICs valid …

Evolution, challenge, and outlook of TSV, 3D IC integration and 3D silicon integration

JH Lau - … symposium on advanced packaging materials (APM), 2011 - ieeexplore.ieee.org
3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They
are different and in general the TSV (through-silicon via) separates 3D IC packaging from …

Wafer-level bonding/stacking technology for 3D integration

CT Ko, KN Chen - Microelectronics reliability, 2010 - Elsevier
Enhanced transmission speeds, lower power consumption, better performance, and smaller
form factors are reported as advantages in many devices and applications when using 3D …

TSV manufacturing yield and hidden costs for 3D IC integration

JH Lau - 2010 Proceedings 60th electronic components and …, 2010 - ieeexplore.ieee.org
3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They
are different and in general, the TSV (through-silicon-via) separates the 3D IC packaging …

Wafer-level Cu–Cu bonding technology

YS Tang, YJ Chang, KN Chen - Microelectronics Reliability, 2012 - Elsevier
Semiconductor industry currently utilizes copper wafer bonding as one of key technologies
for 3D integration. This review paper describes both science and technology of copper wafer …

3-D integration and through-silicon vias in MEMS and microsensors

Z Wang - Journal of Microelectromechanical Systems, 2015 - ieeexplore.ieee.org
After two decades of intensive development, 3-D integration has proven invaluable for
allowing integrated circuits to adhere to Moore's Law without needing to continuously shrink …

Microsystems using three-dimensional integration and TSV technologies: Fundamentals and applications

Z Wang - Microelectronic Engineering, 2019 - Elsevier
As a powerful enabling technology, three-dimensional (3D) integration, which uses wafer
bonding to integrate multiple wafers in the vertical direction and uses through‑silicon-vias …