Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward Endurance Immunity by Opposite Polarity Cycling Recovery (OPCR) for eDRAM

KY Hsiang, JY Lee, ZF Lou, FS Chang… - … on Electron Devices, 2023 - ieeexplore.ieee.org
Opposite polarity cycling recovery (OPCR) is proposed to completely restore a fatigued
antiferroelectric (AFE) capacitor back to its initial state, thereby extending the endurance …

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor

Y Ding, X Yu, C Yan, Z Weng, Y Qu… - 2023 IEEE International …, 2023 - ieeexplore.ieee.org
In this work, the wake-up effect of Hf-based ferroelectric memories has been studied as a
reliability concern, and related mechanisms have been proposed. By changing different …

Polarization and Reliability Enhancement for Ferroelectric Capacitors by Interface Engineering Through Crystalline TaN

YF Chen, CH Wang, HY Shih, CY Kuo… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
A stack formed by consecutive deposition of 2 nm TaN/10 nm HfZrOx (HZO)/2 nm TaN in an
ALD tool was proposed to be sandwiched between thick PVD TiN as the promising structure …

Innovative Recovery Strategy for MFIS-FeFETs at Optimal Timing With Robust Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02%) …

CH Wu, J Liu, XT Zheng, HF Chuang… - … on Electron Devices, 2024 - ieeexplore.ieee.org
This work systematically demonstrates a novel recovery scheme for metal–ferroelectric–
insulator–semiconductor (MFIS) ferroelectric field-effect transistor (FeFET) memory arrays …

Unleashing Endurance Limits of Emerging Memory: Multi-Level FeRAM Recovery Array Empowered by a Coordinated Inverting Amplifier Circuit

KY Hsiang, FS Chang, ZF Lou, A Aich… - … on Electron Devices, 2024 - ieeexplore.ieee.org
Asymmetric field cycling recovery (AFCR) with alternating opposite low-field cycling is
proposed to restore a fatigued ferroelectric (FE) capacitor and is experimentally …

A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices

TT Tan, YY Wang, J Tan, TL Wu… - 2023 IEEE …, 2023 - ieeexplore.ieee.org
Studies on ferroelectric (FE) device degradation are performed on “woken up” devices. The
process of waking up a device is typically done by applying a logarithmically increasing …

Electrical Characterization of Ferroelectric Tunnel Junctions based on Hafnium Oxide for Neuromorphic Applications

J Barbot - 2023 - theses.hal.science
Ferroelectric memories have regained significant interest since the 2010s, following the
discovery of ferroelectricity in hafnium oxide. This breakthrough holds the promise of …