Microstructure, adhesion strength and failure path at a polymer/roughened metal interface

HY Lee, J Qu - Journal of Adhesion Science and Technology, 2003 - Taylor & Francis
Metals and polymers are extensively used in microelectronics packaging where they are
joined together. Since both the yield and reliability of packages are strongly affected by the …

Optimization of black oxide coating thickness as an adhesion promoter for copper substrate in plastic integrated-circuit packages

M Lebbai, JK Kim, WK Szeto, MMF Yuen… - Journal of electronic …, 2003 - Springer
Copper-oxide coating applied onto the copper substrate has emerged as an alternative to
metallic coatings to improve adhesion with polymeric adhesives and molding compounds …

Correlation of flip chip underfill process parameters and material properties with in-process stress generation

P Palaniappan, DF Baldwin, PJ Selman… - IEEE Transactions …, 1999 - ieeexplore.ieee.org
Electronic packaging designs are moving toward fewer levels of packaging to enable
miniaturization and to increase performance of electronic products. One such package …

Warpage of plastic IC packages as a function of processing conditions

DTS Yeung, MMF Yuen - J. Electron. Packag., 2001 - asmedigitalcollection.asme.org
Variation of processing conditions on warpage prediction of a plastic quad flat package
(PQFP) is examined. Thermal mismatch between package constituent materials is the major …

Effects of moisture and elevated temperature on reliability of interfacial adhesion in plastic packages

M Lebbai, JK Kim, MMF Yuen - Journal of electronic materials, 2003 - Springer
The interfacial-adhesion performance between the lead frame and molding compound was
studied after temperature cycles and hygrothermal aging, simulating a typical package …

Enhancing the oxidation resistance of copper by using sandblasted copper surfaces

L Yuan, X Chen, S Maganty, J Cho, C Ke… - Applied Surface Science, 2015 - Elsevier
We show that sandblasting can be employed to effectively enhance the oxidation resistance
of copper by suppressing the interfacial delamination between copper and its oxide by …

Interface adhesion between copper lead frame and epoxy moulding compound: effects of surface finish, oxidation and dimples

JK Kim, M Lebbaj, JH Liu, JH Kim… - 2000 Proceedings. 50th …, 2000 - ieeexplore.ieee.org
A comprehensive study is made of the effects of dimple and finishing material of copper alloy
lead frame on interface adhesion with epoxy moulding compound. The surface plating …

In process stress analysis of flip-chip assemblies during underfill cure

P Palaniappan, DF Baldwin - Microelectronics Reliability, 2000 - Elsevier
Low cost flip chip on board assemblies are analyzed during the underfill cure process to
determine residual stress generation. In situ stress measurements are performed over the …

Chemical kinetic model of interfacial degradation of adhesive joints

DCC Lam, F Yang, P Tong - IEEE Transactions on Components …, 1999 - ieeexplore.ieee.org
Mechanical properties of adhesive joints are degraded in the presence of water. The
progressive decrease in strength has been attributed to propagation of interfacial crack …

Adhesion performance of black oxide coated copper substrates: Effects of moisture sensitivity test

JK Kim, RSC Woo, PYP Hung, M Lebbai - Surface and Coatings …, 2006 - Elsevier
This paper reports the adhesion performance of copper alloy substrates with bare surface,
black oxide coating and surface-hardened black oxide coating. In view of optimizing the …