Apparatus for determining 3-dimensional atomic level structure and method thereof
Y Yongsoo, LEE Juhyeok, C Jeong - US Patent 11,907,812, 2024 - Google Patents
A data generating method includes: an atomic model generating step of generating one or
more three-dimensional atomic models corresponding to a nanomaterial to be measured; a …
more three-dimensional atomic models corresponding to a nanomaterial to be measured; a …