A Class of Tests for Testing Better Failure Rate at Specific Age Distribution With Randomly Right Censored Data
GR Elkahlout - International Journal of Analysis and Applications, 2023 - etamaths.com
A device has a better failure rate at specific age t 0 property, denoted by BFR-t 0 if its failure
rate r (t) increases for t≤ t 0 and for t> t 0, r (t) is not less than its value at t 0. A test statistic is …
rate r (t) increases for t≤ t 0 and for t> t 0, r (t) is not less than its value at t 0. A test statistic is …
[PDF][PDF] Faculty of Business School, Arab Open University, Riyadh, Saudi Arabia
RRC Data, GR Elkahlout - Int. J. Anal. Appl, 2023 - academia.edu
A device has a better failure rate at specific age 𝑡0 property, denoted by 𝐵𝐹𝑅− 𝑡0 if its
failure rate r (t) increases for 𝑡≤ 𝑡0 and for 𝑡> 𝑡0, r (t) is not less than its value at 𝑡0. A test …
failure rate r (t) increases for 𝑡≤ 𝑡0 and for 𝑡> 𝑡0, r (t) is not less than its value at 𝑡0. A test …