Critical challenges in the development of electronics based on two-dimensional transition metal dichalcogenides

Y Wang, S Sarkar, H Yan, M Chhowalla - Nature Electronics, 2024 - nature.com
The development of high-performance electronic devices based on two-dimensional (2D)
transition metal dichalcogenide semiconductors has recently advanced from one-off proof-of …

Design and regulation of defective electrocatalysts

Y Zhang, J Liu, Y Xu, C Xie, S Wang… - Chemical Society Reviews, 2024 - pubs.rsc.org
Electrocatalysts are the key components of electrochemical energy storage and conversion
devices. High performance electrocatalysts can effectively reduce the energy barrier of the …

[HTML][HTML] Studying the defects in spinel compounds: discovery, formation mechanisms, classification, and influence on catalytic properties

T Tatarchuk - Nanomaterials, 2024 - pmc.ncbi.nlm.nih.gov
Spinel ferrites demonstrate extensive applications in different areas, like electrodes for
electrochemical devices, gas sensors, catalysts, and magnetic adsorbents for …

[HTML][HTML] Grayscale Lithography and a Brief Introduction to Other Widely Used Lithographic Methods: A State-of-the-Art Review

SN Khonina, NL Kazanskiy, MA Butt - Micromachines, 2024 - mdpi.com
Lithography serves as a fundamental process in the realms of microfabrication and
nanotechnology, facilitating the transfer of intricate patterns onto a substrate, typically in the …

Footprints of scanning probe microscopy on halide perovskites

S Gupta, S Bhattacharyya - Chemical Communications, 2024 - pubs.rsc.org
Scanning probe microscopy (SPM) and advanced atomic force microscopy (AFM++) have
become pivotal for nanoscale elucidation of the structural, optoelectronic and photovoltaic …

Defect density quantification in monolayer MoS2 using helium atom micro-diffraction

A Radic, N von Jeinsen, K Wang, Y Zhu, I Sami… - arXiv preprint arXiv …, 2024 - arxiv.org
2D materials continue to be pivotal in the advancement of modern devices. Their
optoelectronic, mechanical and thermal properties can be finely modulated using a variety of …

Atomic Defect Quantification by Lateral Force Microscopy

Y Yang, K Xu, LN Holtzman, K Yang, K Watanabe… - ACS …, 2024 - ACS Publications
Atomic defects in two-dimensional (2D) materials impact electronic and optoelectronic
properties, such as doping and single photon emission. An understanding of defect …

Reducing Atomic Defects in 2D Transition Metal Dichalcogenides

Y Zhang, J Wang, H Nong, L He, S Li… - Advanced Functional …, 2024 - Wiley Online Library
Preparing high‐quality 2D semiconductors represented by transition metal dichalcogenides
(TMDCs) is of great importance for the next‐generation devices. However, currently …

Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations

MAR Laskar, S Chakrabarti, S Ahmed… - Materials Science in …, 2025 - Elsevier
As electrical atomic force microscopy (AFM) gains popularity for characterizing two-
dimensional (2D) materials, understanding the relationship between analytical conditions …

[HTML][HTML] Determining the density and spatial descriptors of atomic scale defects of 2H–WSe2 with ensemble deep learning

D Smalley, SD Lough, LN Holtzman… - APL Machine …, 2024 - pubs.aip.org
We have demonstrated atomic-scale defect characterization in scanning tunneling
microscopy images of single crystal tungsten diselenide using an ensemble of U-Net-like …