A time-of-flight range sensor using four-tap lock-in pixels with high near infrared sensitivity for LiDAR applications

S Lee, K Yasutomi, M Morita, H Kawanishi, S Kawahito - Sensors, 2019 - mdpi.com
In this paper, a back-illuminated (BSI) time-of-flight (TOF) sensor using 0.2 µm silicon-on-
insulator (SOI) complementary metal oxide semiconductor (CMOS) technology is developed …

Design and performance of a pinned photodiode CMOS image sensor using reverse substrate bias

KD Stefanov, AS Clarke, J Ivory, AD Holland - Sensors, 2018 - mdpi.com
A new pinned photodiode (PPD) CMOS image sensor with reverse biased p-type substrate
has been developed and characterized. The sensor uses traditional PPDs with one …

Teledyne e2v sensors optimised for ground-based and space applications

P Jorden, D Bourke, R Cassidy… - … Energy, Optical, and …, 2018 - spiedigitallibrary.org
Teledyne e2v continues to develop sensors for ground-based and space applications.
These are back-thinned for high QE, exhibit low noise, and other high performance …

Construction of teaching system of public art major using CMOS image sensor technology

X Yang - Scientific Reports, 2024 - nature.com
The traditional public art education model has many drawbacks. After all, this teaching
model is the most common teaching model. Most colleges and universities still rely on the …

From EBIC images to qualitative minority carrier diffusion length maps

O Marcelot, P Magnan - Ultramicroscopy, 2019 - Elsevier
A novel method is presented with the aim to perform minority carrier diffusion length map on
cross-sectional samples. The method is based on one Electron-Beam Induced Current …

Proton and gamma radiation effects on a fully depleted pinned photodiode CMOS image sensor

X Meng, KD Stefanov… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
The radiation hardness of a fully depleted pinned photodiode (PPD) CMOS image sensor
(CIS) has been evaluated with gamma and proton irradiations. The sensors employ an …

A Backside-Illuminated 3.5 m Pixel With 86% Demodulation Contrast at 1.0 V Voltage Swing for Indirect Time-of-Flight Image Sensors

C Hu, B Zhang, Y Xin, C Wang, Y Xie… - … on Electron Devices, 2023 - ieeexplore.ieee.org
This article presents a stacked backside-illuminated (BSI) indirect time-of-flight (i-ToF) pixel
fabricated in a 65-nm CMOS image sensors (CIS) process. Transfer gate-induced lateral …

[PDF][PDF] A Fully Depleted 52 μm GS CIS Pixel with 6 ns Charge Transfer, 7 e–rms Read Noise, 80 μV/e–CG and> 80% VIS-QE

A Süss, L Wu, JL Bacq, A Spagnolo, P Coppejans… - Proc …, 2017 - imagesensors.org
Imec is developing a CMOS compatible platform for fully depleted image sensors. Full
depletion allows enhancement of the charge collection speed, signal detectivity and …

e2v CMOS and CCD sensors and systems for astronomy

PR Jorden, PA Jerram, M Fryer… - Journal of …, 2017 - iopscience.iop.org
Abstract e2v designs and manufactures a wide range of sensors for space and astronomy
applications. This includes high performance CCDs for X-ray, visible and near-IR …

Characterisation of a novel reverse-biased PPD CMOS image sensor

KD Stefanov, AS Clarke, J Ivory… - Journal of …, 2017 - iopscience.iop.org
A new pinned photodiode (PPD) CMOS image sensor (CIS) has been developed and
characterised. The sensor can be fully depleted by means of reverse bias applied to the …