Impact of fe material thickness on performance of raised source overlapped negative capacitance tunnel field effect transistor (NCTFET)

A Singh, SK Sinha, S Chander - Silicon, 2022 - Springer
Abstract In this work, Raised Source gate overlapped negative capacitance tunnelling field
effect transistor (NC-TFET) is optimized for the first time to suppress the ambipolarity of TFET …

Superior Threshold-Voltage and On-Resistance Stability in GaN HEMTs Enabled by a Gate ESD Protection Circuit

B Wang, Q Song, R Zhang, Y Sun… - 2023 IEEE Applied …, 2023 - ieeexplore.ieee.org
A gate electrostatic discharge (ESD) protection circuit has recently been deployed in GaN p-
gate high electron mobility transistors (HEMTs) to enhance the gate robustness. This on-chip …

Investigation of Threshold Voltage Shift for SiC MOSFET in Switching Operation

R Jin, N Ren, H Xu, K Sheng - 2023 IEEE 2nd International …, 2023 - ieeexplore.ieee.org
Silicon carbide (SiC) MOSFETs has been applied in electrical vehicle (EV) for lower
conduction losses and higher efficiency. But long-term reliability issue especially, the …