5,880,592 5,907,562 5,913,034 5,966,021 5.996, 099 6,011,748 6,049,900 6,056,784
6,057,698 6,081.429 6,085.346 6,097,087 6,114,892 6,133,744 6,246,252 6,247,165 …

US7673208B2 - Storing multicore chip test data - Google Patents US7673208B2 - Storing
multicore chip test data - Google Patents Storing multicore chip test data Download PDF Info …

RSPONSEWECTOR 720 input signal to the DFT circuitry of a second module, such that the
bit sequence can include a set of control signal values for controlling the DFT circuitry, and …

(57) ABSTRACT A method for testing integrated circuits is provided. The method provides for
incorporating compression and decom pression logic into each sub-component of an …

In one embodiments, a system comprises: a plurality of scan test chains configured to
perform test operations at a first clock speed; a central test controller for controlling testing by …

(57) ABSTRACT A system includes a multiple input signature register (MISR) to receive
outputs from M different scan chains in response to N test patterns applied to test an …

At least one embodiment of the present invention provides a circuit and method that allows a
scantest to be performed on integrated circuits manufactured by different companies using a …

(57) Operating a scan chain of a test circuit of an integrated circuit to have either a single
fanout or multiple fanout to a compres sor. The test circuit receives a fanout control signal for …

G06F11/2205—Detection or location of defective computer hardware by testing during
standby operation or during idle time, eg start-up testing using arrangements specific to the …

(57) ABSTRACT A process for electrically testing electronic devices includes connecting at
least one electronic device to an automatic testingapparatus Suitable for testing digital …