Towards a deeper understanding of plastic deformation in mono-crystalline silicon

L Zhang, I Zarudi - International journal of mechanical sciences, 2001 - Elsevier
This paper investigates the plastic deformation in mono-crystalline silicon under complex
loading conditions. With the aid of various characterization techniques, it was found that the …

[图书][B] Crystal Growth and Evaluation of Silicon for VLSI and ULSI

G Eranna - 2015 - api.taylorfrancis.com
Silicon, as a single-crystal semiconductor, has brought about a great revolution in the field of
electronics and has touched almost all fields of science and technology. Though available …

Present status and prospect of Si wafers for ultra large scale integration

H Tsuya - Japanese journal of applied physics, 2004 - iopscience.iop.org
Si wafers have contributed to the rapid growth of the semiconductor industry as a basic
material for ultra large scale integration (ULSI) through the research and development of …

Nano-indentation: A tool to investigate crack propagation related phase transitions in PV silicon

PK Kulshreshtha, KM Youssef, G Rozgonyi - Solar energy materials and …, 2012 - Elsevier
The initiation and propagation of a crack in a silicon wafer introduces local variations in the
stress field and lattice structure through elastic energy release at crack-tip. In this study, the …

A reduced moment-based model for oxygen precipitation in silicon

BC Trzynadlowski, ST Dunham - Journal of Applied Physics, 2013 - pubs.aip.org
A model for the precipitation of oxygen and associated dislocation loops in Czochralski-
grown silicon is presented. Beginning with kinetic rate equations describing the growth and …

Silicon PV Wafers: Mechanical strength and correlations with defects and stress

GA Rozgonyi, KM Youssef, P Kulshreshtha… - Solid State …, 2011 - Trans Tech Publ
Nanoindentation was used to measure the mechanical properties of 200mm diameter (100)
CZ Si wafers subjected to the initiation and propagation of micro-crack defects. Silicon …

Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers

PK Kulshreshtha, YH Yoon, KM Youssef… - Journal of the …, 2011 - iopscience.iop.org
We report on crack propagation in 200 mm diameter Czochralski (CZ) grown silicon wafers
produced for photovoltaic (PV) applications at elevated growth rates. Enhanced thermal …

Influence of grown-in defects on final oxygen precipitates during heat treatment of Cz-Si wafer analyzed by a coupled model with the interaction of point defects …

B Gao, M Juel, M Mhamdi - Journal of Crystal Growth, 2016 - Elsevier
To illuminate the role of crystal growth process on final oxygen precipitates during heat
treatment of Cz-Si wafer, a coupled model, including the interaction of oxygen precipitates …

Reduced Moment-Based Models for Oxygen Precipitates and Dislocation Loops in Silicon

B Trzynadlowski - 2013 - digital.lib.washington.edu
The demand for ever smaller, higher-performance integrated circuits and more efficient, cost-
effective solar cells continues to push the frontiers of process technology. Fabrication of …

Plasticity in monocrystalline silicon: experiment and modelling

LC Zhang - Key Engineering Materials, 2004 - Trans Tech Publ
The plastic deformation and microstructural changes in mono-crystalline silicon under
various conditions have been the research focus over decades, including hydrostatic …