The effect of system workload on error latency: An experimental study

R Chillarege, RK Lyer - Proceedings of the 1985 ACM SIGMETRICS …, 1985 - dl.acm.org
In this paper, a methodology for determining and characterizing error latency is developed.
The method is based on real workload data, gathered by an experiment instrumented on a …

Wear-out simulation environment for VLSI designs

GS Choi, RK Iyer - FTCS-23 The Twenty-Third International …, 1993 - ieeexplore.ieee.org
A simulation-based approach for the reliability prediction of VLSI designs is introduced. The
approach combines the switch-level circuit simulation and the device-level Monte Carlo …

Bibliography of literature on computer hardware reliability

BS Dhillon, KI Ugwu - Microelectronics Reliability, 1986 - Elsevier
Bibliography of literature on computer hardware reliability - ScienceDirect Skip to main
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[图书][B] Fault and error latency under real workload-an experimental study

R Chillarege - 1986 - search.proquest.com
This thesis demonstrates a practical methodology for the study of fault and error latency
under real workload. This is the first study that measures and quantifies the latency under …

[图书][B] Fault sensitivity and wear-out analysis of VLSI systems

GS Choi - 1994 - search.proquest.com
This thesis describes simulation approaches to conduct fault sensitivity and wear-out failure
analysis of VLSI systems. A fault-injection approach to study transient impact in VLSI …

A Monte Carlo simulation environment for wear out in VLSI systems

GS Choi, RK Iyer, JH Patel - Proceedings. Fourth CSI/IEEE …, 1991 - computer.org
The authors describe a simulation environment for reliability prediction of VLSI designs.
Specifically, the effect of electromigration on the time-to-failure is investigated. The …

[图书][B] Parallel input/output architectures for multiprocessors

NRL Annapareddy - 1990 - search.proquest.com
This thesis looks at several aspects of solving the Input/Output problem. The increasing
processor speeds and the emerging multiprocessor machines have improved the …

Software upset analysis: A case study of the HS1602 microprocessor

GS Choi, RK Iyer - Proceedings of 1993 IEEE 2nd Asian Test …, 1993 - ieeexplore.ieee.org
This paper describes a simulation based approach to quantify the impact of low-level
transient errors at the software execution level. Automated analysis, for the run-time injection …

Reliable Digital Systems and Related Stanford University Research

EJ McCluskey - The Evolution of Fault-Tolerant Computing: In the …, 1987 - Springer
The various types of digital system applications as they relate to the required reliability
characteristics are surveyed. High quality, cost-effective repair is identified as the most …