We advocate defect tolerant design to improve timing yield. A metric of defect tolerance is
proposed, and an approach based on using defect tolerance metrics, derived for each cell in …

In the latest technology nodes, there is a growing concern about yield loss due to timing
failures and delay degradation resulting from manufacturing complexities. Largely, these …

Two important aspects of design-for-yield (DFY) are the design for functional yield and
parametric yield. While occurrences of gross defects leading to functional yield loss are fixed …