A laser processing system implements a method for aligning a probe element (eg, a probe
pin) with a device interface element (eg, a contact pad of a circuit substrate). First, the laser …

BACKGROUND Optoelectronic integrated circuits (ICs) include both elec tronic and optical
elements Within a single chip. Typical elec tronic elements include? eld effect transistors …

Waveguide-to-waveguide couplers, systems that include waveguide-to-waveguide couplers,
and methods of fabricating waveguide-to-waveguide couplers. A first waveguide is coupled …

BACKGROUND In the current manufacture of semiconductor devices, functionality of
electrical devices is verified at the wafer level by automated test equipment using probe …

An efficient grating coupler for a semiconductor optical mode includes a tapered edge to
couple light between waveguide modes constrained by differing waveguide thicknesses. An …

The portion of the first light beam propagates in a first 4,135,822 A 1, 1979 Ezekiel counter-
propagating direction, and the portion of the second 4,234,357. A 1 1/1980 Scheppele light …

---(57) ABSTRACT (60) Division of application No. 10/317,935, filed on Dec. 11, 2002, which
is a continuation of application No. Method and apparatus for utilizing a probe card for …

US9922887B2 - Wafer-scale testing of photonic integrated circuits using horizontal spot-size
converters - Google Patents US9922887B2 - Wafer-scale testing of photonic integrated …

A qualification apparatus for a photonic chip on a wafer that leaves undisturbed an edge
coupler that provides an operating port for the photonic devices or circuits on the chip during …

There is provided a test apparatus for testing a device under test, including a test signal
generator that generates a test signal to test the device under test, an electric-photo …